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Ultramicroscopy|February 24, 2012
Using a monochromator to improve the resolution in TEM to below 0.5Å. Part I: Creating highly coherent monochromated illuminationP C Tiemeijer, M Bischoff, B Freitag, et al.Ultramicroscopy|March 16, 2012
Accurate segmentation of dense nanoparticles by partially discrete electron tomographyT Roelandts, K J Batenburg, E Biermans, et al.Ultramicroscopy|May 1, 1991
Historical perspective and current trends in emission microscopy, mirror electron microscopy and low-energy electron microscopy. An introduction to the proceedings of the Second International Symposium and Workshop on Emission microscopy and Related TechniquesO H Griffith, W EngelUltramicroscopy|September 5, 2008
Analysis of InAsN quantum dots by transmission electron microscopy and photoluminescenceChiung-Chih Hsu, Ray-Quen Hsu, Yue-Han Wu, et al.Ultramicroscopy|September 3, 2008
Near-field visualization of dynamical processes of semiconductor surfaceV Z Lozovski, V O VasilenkoUltramicroscopy|September 25, 2007
Reduction of electrical damage in specimens prepared using focused ion beam milling for dopant profiling using off-axis electron holographyDavid Cooper, Robert Truche, Jean-Luc RouviereUltramicroscopy|July 29, 2008
Real-time observations of mechanical stimulus-induced enhancements of mechanical properties in osteoblast cellsXu Zhang, Xiaoli Liu, Jialun Sun, et al.Ultramicroscopy|July 29, 2008
Measurement of specimen thickness by phase change determination in TEMM D Croitoru, D Van Dyck, Y Z Liu, et al.Ultramicroscopy|July 19, 2008
Effects of strain gradients on strain measurements using geometrical phase analysis in the transmission electron microscopeJayhoon Chung, Lew RabenbergUltramicroscopy|March 31, 2012
Micromagnetic study of flux-closure states in Fe dots using quantitative Lorentz microscopyAurélien Masseboeuf, Olivier Fruchart, Fabien Cheynis, et al.Pageof 460