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Ultramicroscopy|August 24, 2010
Design of an aberration corrected low-voltage SEMR H van Aken, D J Maas, C W Hagen, et al.Ultramicroscopy|August 24, 2010
Single cell mechanics of keratinocyte cellsValentin Lulevich, Hsin-ya Yang, R Rivkah Isseroff, et al.Ultramicroscopy|December 15, 2010
Throughput maximization of particle radius measurements through balancing size versus current of the electron probeW Van den Broek, S Van Aert, P Goos, et al.Ultramicroscopy|December 15, 2010
In situ EELS study of dehydration of Al(OH)₃ by electron beam irradiationNan Jiang, John C H SpenceUltramicroscopy|November 25, 2010
Bright-field scanning confocal electron microscopy using a double aberration-corrected transmission electron microscopePeng Wang, Gavin Behan, Angus I Kirkland, et al.Ultramicroscopy|November 25, 2010
Compressive auto-indexing in femtosecond nanocrystallographyFilipe R N C Maia, Chao Yang, Stefano MarchesiniUltramicroscopy|December 1, 2010
Application of highly silicon-doped marker layers in the investigation of unintentional doping in GaN on sapphireR A OliverUltramicroscopy|May 18, 2010
Impact of laser pulsing on the reconstruction in an atom probe tomographyBaptiste Gault, Alex La Fontaine, Michael P Moody, et al.Ultramicroscopy|April 27, 2010
Optimization of pulsed laser atom probe (PLAP) for the analysis of nanocomposite Ti-Si-N filmsFengzai Tang, Baptiste Gault, Simon P Ringer, et al.Ultramicroscopy|August 12, 2009
StripeSTEM, a technique for the isochronous acquisition of high angle annular dark-field images and monolayer resolved electron energy loss spectraM Heidelmann, J Barthel, L HoubenPageof 460