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Ultramicroscopy|January 1, 1978
Radiation damage due to knock-on processes on carbon foils cooled to liquid helium temperatureI Dietrich, F Fox, H G Heide, et al.
Ultramicroscopy|May 24, 2021
Dimensionality reduction and unsupervised clustering for EELS-SIJinseok Ryu, Hyeohn Kim, Ryeong Myeong Kim, et al.
Ultramicroscopy|May 13, 2021
Influence of electron landing energy on the measurement of the dimensional properties of nanoparticle populations imaged by SEMLoïc Crouzier, Alexandra Delvallée, Laurent Devoille, et al.
Ultramicroscopy|June 3, 2020
Evaluation of different rectangular scan strategies for STEM imagingA Velazco, M Nord, A Béché, et al.
Ultramicroscopy|June 3, 2020
A High Accuracy Ion Conductance Imaging Method Based on the Approach Curve SpectrumYangbohan Jiao, Jian Zhuang, Qiangqiang Zheng, et al.
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