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Ultramicroscopy|June 3, 2020
Evaluation of different rectangular scan strategies for STEM imagingA Velazco, M Nord, A Béché, et al.
Ultramicroscopy|June 3, 2020
A High Accuracy Ion Conductance Imaging Method Based on the Approach Curve SpectrumYangbohan Jiao, Jian Zhuang, Qiangqiang Zheng, et al.
Ultramicroscopy|May 20, 2021
Relative roles of multiple scattering and Fresnel diffraction in the imaging of small molecules using electrons, Part II: Differential Holographic TomographyT E Gureyev, H M Quiney, A Kozlov, et al.
Ultramicroscopy|May 21, 2021
Reconstructing porous structures from FIB-SEM image data: Optimizing sampling scheme and image processingDiego Roldán, Claudia Redenbach, Katja Schladitz, et al.
Ultramicroscopy|August 8, 2021
Numerical simulations of field emission characteristics of open CNTSergey Vladimirovich Filippov, Eugeni Olegovich Popov, Anatoly Grigorievich Kolosko
Ultramicroscopy|February 16, 2023
A decade of atom-counting in STEM: From the first results toward reliable 3D atomic models from a single projectionA De Backer, S Bals, S Van Aert
Ultramicroscopy|April 3, 2001
Orientation dependence of ionization edges in EELSP Schattschneider, C Hébert, B Jouffrey
Ultramicroscopy|March 31, 2000
Multiple-input microcantilever sensorsBritton, Jones, Oden, et al.
Ultramicroscopy|March 31, 2000
Whisker probesGivargizov, Stepanova, Obolenskaya, et al.
Ultramicroscopy|March 31, 2000
Amplitude curves and operating regimes in dynamic atomic force microscopyGarcia, San Paulo A
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