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Ultramicroscopy|November 12, 2002
The separation of surface and bulk contributions in ELNES spectraP Schattschneider, M Stöger, C Hébert, et al.Ultramicroscopy|November 12, 2002
Direct compositional analysis of AlGaAs/GaAs heterostructures by the reciprocal space segmentation of high-resolution micrographsK Tillmann, M Luysberg, P Specht, et al.Ultramicroscopy|January 5, 2002
Early detection of cytotoxic events between hepatic natural killer cells and colon carcinoma cells as probed with the atomic force microscopeF Braet, D Vermijlen, V Bossuyt, et al.Ultramicroscopy|July 26, 2002
Investigations on field-ion image formation and field evaporation sequences of DO3-ordered Fe3AlGeorg Frommeyer, Zhi-Guo Liu, Jürgen Wesemann, et al.Ultramicroscopy|December 1, 1975
A method for the improvement of the visibility of transmission electron microscope imagesW M Stobbs, U ValdrèUltramicroscopy|July 1, 1975
On dark field techniques in transmission electron microscopyK Shirota, T Yamamoto, T YanakaUltramicroscopy|December 1, 1975
Aperture contrast in thick amorphous specimens using scanning transmission electron microscopyD J Smith, J M CowleyUltramicroscopy|July 21, 2001
Beam characteristics for various sizes of annular aperture on scanning electron microscopeT Ishitani, M Sato, H TodokoroUltramicroscopy|July 21, 2001
The concept of high angle wedge polishing and thickness monitoring in TEM sample preparationH Li, L Salamanca-RibaUltramicroscopy|June 1, 1995
Automatic particle picking from electron micrographsK R Lata, P Penczek, J FrankPageof 458