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Ultramicroscopy|August 30, 2005
Precise measurement of third-order spherical aberration using low-order zone-axis RonchigramsTakashi Yamazaki, Yasutoshi Kotaka, Yoshio Kikuchi, et al.Ultramicroscopy|August 30, 2005
Determination of the mean inner potential in III-V semiconductors, Si and Ge by density functional theory and electron holographyP Kruse, M Schowalter, D Lamoen, et al.Ultramicroscopy|May 6, 2006
Investigation of scale effects and directionality dependence on friction and adhesion of human hair using AFM and macroscale friction test apparatusCarmen LaTorre, Bharat BhushanUltramicroscopy|May 3, 2006
Nanotribological and nanomechanical characterization of human hair using a nanoscratch techniqueGuohua Wei, Bharat BhushanUltramicroscopy|May 3, 2006
Studying silane mobility on hydrated mica using ambient AFMNeal Crampton, William A Bonass, Jennifer Kirkham, et al.Ultramicroscopy|July 29, 2006
Room design for high-performance electron microscopyDavid A Muller, Earl J Kirkland, Malcolm G Thomas, et al.Ultramicroscopy|August 1, 2006
Electric near-field enhancing properties of a finite-size metal conical nano-tipA V Goncharenko, Hung-Chih Chang, Juen-Kai WangUltramicroscopy|July 28, 2006
Peak assignments of ELNES and XANES using overlap population diagramsTeruyasu Mizoguchi, Kazuyoshi Tatsumi, Isao TanakaUltramicroscopy|August 29, 2006
Experiments on inelastic electron holographyP L Potapov, H Lichte, J Verbeeck, et al.Ultramicroscopy|August 15, 2006
Stroboscopic image capture: reducing the dose per frame by a factor of 30 does not prevent beam-induced specimen movement in paraffinDieter Typke, Christopher J Gilpin, Kenneth H Downing, et al.Pageof 460