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Ultramicroscopy|August 26, 2022
Photovoltaic and photothermal effects induced by visible laser radiation in atomic force microscopy probesM D Pichois, X Henning, M A Hurier, et al.Ultramicroscopy|February 14, 2021
Principal image decomposition for multi-detector backscatter electron topography reconstructionJan Neggers, Eva Héripré, Marc Bonnet, et al.Ultramicroscopy|February 19, 2021
Plasmon energy losses in shear bands of metallic glassMaximilian Grove, Martin Peterlechner, Harald Rösner, et al.Ultramicroscopy|January 1, 1988
Observations of restricted beam-induced specimen motion with small-spot illuminationK H DowningUltramicroscopy|September 3, 2019
Tunable electron beam pulser for picoseconds stroboscopic microscopy in transmission electron microscopesChunguang Jing, Yimei Zhu, Ao Liu, et al.Ultramicroscopy|September 24, 2019
Ni-base superalloy single crystal (SX) mosaicity characterized by the Rotation Vector Base Line Electron Back Scatter Diffraction (RVB-EBSD) methodP Thome, S Medghalchi, J Frenzel, et al.Ultramicroscopy|August 18, 2019
Quantitative analysis of electron channeling contrast of dislocationsIvan Gutierrez-UrrutiaUltramicroscopy|August 18, 2019
Conventional vs. model-based measurement of patterned line widths from scanning electron microscopy profilesFrancesc Salvat-Pujol, John S VillarrubiaUltramicroscopy|October 24, 2018
Sources of error in Debye-Waller-effect measurements relevant to studies of photoinduced structural dynamicsElisah J VandenBussche, David J FlanniganUltramicroscopy|March 2, 2019
Coverage-driven phase transition of copper silicide monolayer on Si (111)Lin Zhu, Zheng Wei, Guodong Shi, et al.Pageof 460