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Ultramicroscopy|August 18, 2019
Conventional vs. model-based measurement of patterned line widths from scanning electron microscopy profilesFrancesc Salvat-Pujol, John S VillarrubiaUltramicroscopy|October 24, 2018
Sources of error in Debye-Waller-effect measurements relevant to studies of photoinduced structural dynamicsElisah J VandenBussche, David J FlanniganUltramicroscopy|March 2, 2019
Coverage-driven phase transition of copper silicide monolayer on Si (111)Lin Zhu, Zheng Wei, Guodong Shi, et al.Ultramicroscopy|December 20, 2021
Spectrum imaging measurements with semi-parallel detection using an AES apparatusNoboru Taguchi, Tatsuya Uchida, Konomi Ikita, et al.Ultramicroscopy|December 23, 2021
Effect of electron beam irradiation on the temperature of single AuGe nanoparticles in a TEMAleksandr Kryshtal, Mikolaj Mielczarek, Jakub PawlakUltramicroscopy|July 21, 2019
Imaging properties of hemispherical electrostatic energy analyzers for high resolution momentum microscopyChristian Tusche, Ying-Jiun Chen, Claus M Schneider, et al.Ultramicroscopy|August 5, 2019
An inelastic multislice simulation method incorporating plasmon energy lossesB G MendisUltramicroscopy|March 30, 2019
Fourier optics of image formation in aberration-corrected LEEMK M Yu, K L W Lau, M S AltmanUltramicroscopy|March 30, 2019
Tip wear and tip breakage in high-speed atomic force microscopesTimo Strahlendorff, Gaoliang Dai, Detlef Bergmann, et al.Ultramicroscopy|March 11, 2014
In situ determination of misorientation angle of grain boundary by field ion microscopy analysisJun Takahashi, Kazuto Kawakami, Yukiko KobayashiPageof 458