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Ultramicroscopy|March 31, 2007
Depth sectioning in scanning transmission electron microscopy based on core-loss spectroscopyA J D'Alfonso, S D Findlay, M P Oxley, et al.Ultramicroscopy|January 16, 2007
Crystal structure refinement using Bloch-wave method for precession electron diffractionA P Dudka, A S Avilov, S NicolopoulosUltramicroscopy|November 3, 2006
Design of a microfabricated, two-electrode phase-contrast element suitable for electron microscopyRossana Cambie, Kenneth H Downing, Dieter Typke, et al.Ultramicroscopy|September 9, 2006
Transmission microscopy without lenses for objects of unlimited sizeJ M Rodenburg, A C Hurst, A G CullisUltramicroscopy|December 13, 2006
Cantilever dynamics and quality factor control in AC mode AFM height measurementsLiwei Chen, Xuechun Yu, Dan WangUltramicroscopy|June 7, 2005
A separation of the refractive index and topography in photon-scanning tunneling microscopy: simulations and experimentsXiaoqiu Wang, Jian Zhang, Yinli Li, et al.Ultramicroscopy|June 7, 2005
Nanoscale TiO island formation on the SrTiO3(001) surface studied by in situ high-resolution transmission electron microscopySung Bo Lee, Fritz Phillipp, Wilfried Sigle, et al.Ultramicroscopy|August 6, 2005
Comparison of intensity distributions in tomograms from BF TEM, ADF STEM, HAADF STEM, and calculated tilt seriesH Friedrich, M R McCartney, P R BuseckUltramicroscopy|June 29, 2005
Maximum likelihood estimation of structure parameters from high resolution electron microscopy images. Part II: a practical exampleS Van Aert, A J den Dekker, A van den Bos, et al.Ultramicroscopy|June 29, 2005
Modelling imaging based on core-loss spectroscopy in scanning transmission electron microscopyS D Findlay, M P Oxley, S J Pennycook, et al.Pageof 460