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Ultramicroscopy|September 10, 2013
Enhanced light element imaging in atomic resolution scanning transmission electron microscopyS D Findlay, Y Kohno, L A Cardamone, et al.Ultramicroscopy|September 10, 2013
When to use the projection assumption and the weak-phase object approximation in phase contrast cryo-EMMiloš Vulović, Lenard M Voortman, Lucas J van Vliet, et al.Ultramicroscopy|August 13, 2013
Thermal mapping of a scanning thermal microscopy tipGrzegorz Jóźwiak, Grzegorz Wielgoszewski, Teodor Gotszalk, et al.Ultramicroscopy|September 3, 2013
Cantilever dynamics in Heterodyne Force MicroscopyG J Verbiest, T H Oosterkamp, M J RostUltramicroscopy|September 17, 2013
Assessing the precision of strain measurements using electron backscatter diffraction--part 2: experimental demonstrationT B Britton, J Jiang, R Clough, et al.Ultramicroscopy|August 24, 2013
Probe integrated scattering cross sections in the analysis of atomic resolution HAADF STEM imagesH E, K E Macarthur, T J Pennycook, et al.Ultramicroscopy|August 17, 2013
To see or not to see: imaging surfactant coated nano-particles using HIM and SEMGregor Hlawacek, Imtiaz Ahmad, Mark A Smithers, et al.Ultramicroscopy|August 20, 2013
Finite element simulations of electrostatic dopant potentials in thin semiconductor specimens for electron holographyP K Somodi, A C Twitchett-Harrison, P A Midgley, et al.Ultramicroscopy|June 11, 2013
Ranking TEM cameras by their response to electron shot noisePatricia Grob, Derek Bean, Dieter Typke, et al.Pageof 460