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Ultramicroscopy|May 26, 2018
Double-tilt in situ TEM holder with ultra-high stabilityMingjie Xu, Sheng Dai, Thomas Blum, et al.
Ultramicroscopy|May 25, 2019
π/2 mode converters and vortex generators for electronsC Kramberger, S Löffler, T Schachinger, et al.
Ultramicroscopy|May 27, 2019
Mesoscopic quantitative chemical analyses using STEM-EDX in current and next generation polycrystalline Ni-based superalloysH S Kitaguchi, Ian P Jones, Yulung Chiu, et al.
Ultramicroscopy|May 13, 2019
Extending ζ-factor microanalysis to boron-rich ceramics: Quantification of bulk stoichiometry and grain boundary compositionC J Marvel, K D Behler, J C LaSalvia, et al.
Ultramicroscopy|September 27, 2017
Contact atomic force microscopy using piezoresistive cantilevers in load force modulation modeP Biczysko, A Dzierka, G Jóźwiak, et al.
Ultramicroscopy|September 25, 2017
Frozen lattice and absorptive model for high angle annular dark field scanning transmission electron microscopy: A comparison study in terms of integrated intensity and atomic column position measurementM Alania, I Lobato, S Van Aert
Ultramicroscopy|October 10, 2017
Charging of carbon thin films in scanning and phase-plate transmission electron microscopySimon Hettler, Emi Kano, Manuel Dries, et al.
Ultramicroscopy|February 5, 2020
Simulation-based optimisation of thermodynamic conditions in the ESEM for dynamical in-situ study of spherical polyelectrolyte complex particles in their native stateVilém Neděla, Eva Tihlaříková, Jiří Maxa, et al.
Ultramicroscopy|June 26, 2021
Symmetry of diffraction patterns of two-dimensional crystal structuresTatiana Latychevskaia, Recep Zan, Sergey Morozov, et al.
Ultramicroscopy|May 11, 2022
The effect of work function during electron spectroscopy measurements in Scanning Field-Emission MicroscopyMichal Bodik, Christopher Walker, Maksym Demydenko, et al.
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