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Ultramicroscopy|May 13, 2022
Multislice method based full-space analysis on mechanical interaction of electron vortex beam with a crystalline particleTe Shi, Z J DingUltramicroscopy|May 8, 2022
Angle-dependence of ADF-STEM intensities for chemical analysis of InGaN/GaNTim Grieb, Florian F Krause, Knut Müller-Caspary, et al.Ultramicroscopy|March 20, 2018
A deep convolutional neural network to analyze position averaged convergent beam electron diffraction patternsW Xu, J M LeBeauUltramicroscopy|March 17, 2018
Imaging and electron energy-loss spectroscopy using single nanosecond electron pulsesMatthieu Picher, Kerstin Bücker, Thomas LaGrange, et al.Ultramicroscopy|March 18, 2018
Correlative Raman spectroscopy and focused ion beam for targeted phase boundary analysis of titania polymorphsJohn S Mangum, Lisa H Chan, Ute Schmidt, et al.Ultramicroscopy|February 26, 2018
Spherical aberration correction with an in-lens N-fold symmetric line currents modelShahedul Hoque, Hiroyuki Ito, Ryuji NishiUltramicroscopy|February 27, 2018
Software electron counting for low-dose scanning transmission electron microscopyAndreas Mittelberger, Christian Kramberger, Jannik C MeyerUltramicroscopy|June 6, 2022
Electron ptychography dose reduction using Moiré sampling on periodic structuresMohammad Taghi Hashemi, Alexandre Pofelski, Gianluigi A BottonUltramicroscopy|May 22, 2022
Quantitative atomic force microscopy: A statistical treatment of high-speed AFM data for quality control applicationsDhilan S Devadasan, Mark A Baker, John F WattsUltramicroscopy|June 18, 2022
Reducing electron beam damage through alternative STEM scanning strategies, Part II: Attempt towards an empirical model describing the damage processD Jannis, A Velazco, A Béché, et al.Pageof 460