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Ultramicroscopy|October 28, 2008
Quantitative structural analysis of twin boundary in alpha-Zn7Sb2O12 using HAADF STEM methodKoji Kuramochi, Kentaro Suzuki, Takashi Yamazaki, et al.Ultramicroscopy|October 25, 2008
Data scattering in scanning tunneling spectroscopyN Severin, S Groeper, R Kniprath, et al.Ultramicroscopy|August 30, 2005
Nanoscale electrical characterization of semiconducting polymer blends by conductive atomic force microscopy (C-AFM)A Alexeev, J Loos, M M KoetseUltramicroscopy|August 30, 2005
Rapid structure determination of a metal oxide from pseudo-kinematical electron diffraction dataC S Own, W Sinkler, L D MarksUltramicroscopy|August 30, 2005
An expanded approach to noise reduction from high-resolution STEM images based on the maximum entropy methodNobuto Nakanishi, Yasutoshi Kotaka, Takashi YamazakiUltramicroscopy|August 23, 2005
Conductive transparent fiber probes for shear-force atomic force microscopesTooru MurashitaUltramicroscopy|August 23, 2005
Mounting of Escherichia coli spheroplasts for AFM imagingC J Sullivan, J L Morrell, D P Allison, et al.Ultramicroscopy|February 13, 2007
Precession electron diffraction: observed and calculated intensitiesP Oleynikov, S Hovmöller, X D ZouUltramicroscopy|February 24, 2007
Uncooled IR imaging using optomechanical detectorsZhengyu Miao, Qingchuan Zhang, Dapeng Chen, et al.Ultramicroscopy|March 21, 2007
Wear characteristics of diamond-coated atomic force microscope probeKoo-Hyun Chung, Dae-Eun KimPageof 458