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Related Concept Videos

Atomic Force Microscopy01:08

Atomic Force Microscopy

Atomic force microscopy (AFM) is a type of scanning probe microscopy that can analyze topographic details of various specimens like ceramics, glass, polymers, and biological samples. AFM offers over 1000 times more resolution than the optical imaging system. Images generated from AFM are three-dimensional surface profiles, offering an advantage over the flat, two-dimensional images from other imaging techniques.
The AFM Probe
The probe is regarded as the heart of any AFM setup and comprises the...
Electron Microscope Tomography and Single-particle Reconstruction01:07

Electron Microscope Tomography and Single-particle Reconstruction

Transmission electron microscopy (TEM) can be used to determine the 3D structure of biological samples with the help of techniques such as electron microscope tomography and single-particle reconstruction. While single-particle reconstruction can examine macromolecules and macromolecular complexes in vitro conditions only, tomography permits the study of cell components or small cells in vivo.
Electron Tomography
Electron tomography can be performed either in TEM or STEM (scanning transmission...
Overview of Microscopy Techniques01:22

Overview of Microscopy Techniques

The early pioneers of microscopy opened a window into the invisible world of microorganisms. In 1830, Joseph Jackson Lister created an essentially modern light microscope. The 20th century saw the development of microscopes that leveraged nonvisible light, such as fluorescence microscopy that uses an ultraviolet light source and electron microscopy that uses short-wavelength electron beams. These advances significantly improved magnification, image resolution, and contrast. By comparison, the...

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Related Experiment Video

Updated: May 17, 2026

Atom Probe Tomography Analysis of Exsolved Mineral Phases
08:14

Atom Probe Tomography Analysis of Exsolved Mineral Phases

Published on: October 25, 2019

Full tip imaging in atom probe tomography.

Sichao Du1, Timothy Burgess, Shyeh Tjing Loi

  • 1School of Physics, The University of Sydney, NSW 2006, Australia.

Ultramicroscopy
|November 13, 2012
PubMed
Summary
This summary is machine-generated.

Atom probe tomography (APT) can now image entire specimens, including their shells, overcoming previous field-of-view limitations. This breakthrough enables comprehensive analysis of materials like III-V nanowires by utilizing substrate proximity for enhanced imaging.

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Area of Science:

  • Materials Science
  • Nanotechnology
  • Surface Science

Background:

  • Atom probe tomography (APT) provides atomic-scale 3D chemical analysis but is limited by a narrow field-of-view (FOV).
  • Analyzing the entire specimen, especially the shell, is critical for understanding material properties and behavior.
  • Existing limitations restrict comprehensive analysis of nanostructures like nanowires.

Purpose of the Study:

  • To overcome the limited FOV in APT for analyzing the complete tip of specimens.
  • To demonstrate a method for imaging the entire specimen, including the shell, in III-V nanowire analysis.
  • To enhance the analytical capacity of APT for nanostructured materials.

Main Methods:

  • Utilizing the proximity of a flat substrate to alter field distribution and ion trajectories during APT analysis.
  • Performing electrostatic simulations to understand and confirm the observed imaging effects.
  • Acquiring and analyzing field desorption maps, elemental distributions, and crystallographic features.

Main Results:

  • The presence of a nearby substrate effectively compresses the image, enabling the analysis of the entire specimen tip.
  • Experimental results, including elemental and crystallographic mapping, confirm whole-tip imaging.
  • Electrostatic simulations validated the mechanism of enhanced image compression.

Conclusions:

  • Substrate-induced field manipulation in APT allows for imaging beyond the conventional FOV.
  • This technique significantly enhances the utility of APT for analyzing nanostructures, particularly III-V nanowires.
  • Comprehensive atomic-scale analysis of entire nanostructures is now achievable, opening new avenues for materials research.