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Ultramicroscopy|August 18, 2020
Analysis of nanoscale fluid inclusions in geomaterials by atom probe tomography: Experiments and numerical simulationsR Dubosq, B Gault, C Hatzoglou, et al.Ultramicroscopy|July 31, 2020
Aggregated nanoparticles: Sample preparation and analysis by atom probe tomographyCédric Barroo, Austin J Akey, David C BellUltramicroscopy|August 4, 2020
3D characterisation using plasma FIB-SEM: A large-area tomography technique for complex surfaces like black siliconYu Zhang, Charlie Kong, Rasmus Schmidt Davidsen, et al.Ultramicroscopy|April 26, 2021
Angular dynamics of small nanoparticles induced by non-vortex electron beamsJosé Ángel Castellanos-Reyes, Jesús Castrejón-Figueroa, Alejandro Reyes-CoronadoUltramicroscopy|April 7, 2023
First step toward complex observations by 4D-STEM with phase plateMayu Togashi, Hiroki MinodaUltramicroscopy|April 12, 2023
Dynamic evolution mechanism of scanning moiré fringesYangrui Liu, Pengfei Nan, Yangjian Lin, et al.Ultramicroscopy|April 27, 2021
Gradient-based and wavelet-based compressed sensing approaches for highly undersampled tomographic datasetsMartin Jacob, Loubna El Gueddari, Jyh-Miin Lin, et al.Ultramicroscopy|April 1, 2023
espm: A Python library for the simulation of STEM-EDXS datasetsAdrien Teurtrie, Nathanaël Perraudin, Thomas Holvoet, et al.Ultramicroscopy|April 9, 2023
Portable low-cost and highly accurate programmable triggering controller for confocal spinning disk image scanning microscopeEli Flaxer, Alona Flaxer, Moran Sapir, et al.Ultramicroscopy|September 15, 2007
A quantitative analysis of the cone-angle dependence in precession electron diffractionJ Ciston, B Deng, L D Marks, et al.Pageof 460