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Ultramicroscopy|November 11, 2008
C2H2 interaction with Ni nanocrystals: towards a better understanding of carbon nanotubes nucleation in CVD synthesisM Moors, T Visart de Bocarmé, N KruseUltramicroscopy|July 21, 2007
Vacuolar structures can be identified by AFM elasticity mappingChristoph Riethmüller, Tilman E Schäffer, Ferry Kienberger, et al.Ultramicroscopy|July 24, 2007
Analysis of nanocrystalline films on rough substratesV Cimalla, T Machleidt, L Spiess, et al.Ultramicroscopy|July 10, 2007
Mapping inelastic intensities in diffraction patterns of magnetic samples using the energy spectrum imaging techniqueB Warot-Fonrose, F Houdellier, M J Hÿtch, et al.Ultramicroscopy|July 10, 2007
A study in the computation time required for the inclusion of strain field effects in Bloch-wave simulations of TEM diffraction contrast imagesB J Dulong, R D Haynes, M D RobertsonUltramicroscopy|July 17, 2007
Composition analysis of semiconductor quantum wells by energy filtered convergent-beam electron diffractionD Jacob, J M Zuo, A Lefebvre, et al.Ultramicroscopy|June 30, 2007
Measurement of twofold astigmatism of probe-forming lens using low-order zone-axis ronchigramKoji Kuramochi, Takashi Yamazaki, Yasutoshi Kotaka, et al.Ultramicroscopy|July 10, 2007
Imaging Si nanoparticles embedded in SiO(2) layers by (S)TEM-EELSS Schamm, C Bonafos, H Coffin, et al.Ultramicroscopy|February 10, 2009
Carbide characterization in low-temperature tempered steelsChen Zhu, Alfred Cerezo, George D W SmithUltramicroscopy|January 24, 2009
A coherence approach to phase-contrast microscopy II: experimentB D Arhatari, A G Peele, K Hannah, et al.Pageof 460