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Ultramicroscopy|February 13, 2013
A model to predict image formation in Atom probe TomographyF Vurpillot, A Gaillard, G Da Costa, et al.
Ultramicroscopy|March 12, 2013
Design of a focused electron beam column for ring-cathode sourcesAnjam Khursheed
Ultramicroscopy|February 19, 2013
Scribble, scribble, scribbleP W Hawkes
Ultramicroscopy|September 10, 2013
Quantitative EDXS analysis of organic materials using the ζ-factor methodStefanie Fladischer, Werner Grogger
Ultramicroscopy|September 10, 2013
Lattice and strain analysis of atomic resolution Z-contrast images based on template matchingJian-Min Zuo, Amish B Shah, Honggyu Kim, et al.
Ultramicroscopy|September 10, 2013
Continuous capacitance-voltage spectroscopy mapping for scanning microwave microscopyM Moertelmaier, H P Huber, C Rankl, et al.
Ultramicroscopy|September 10, 2013
Effective temperature of an ultracold electron source based on near-threshold photoionizationW J Engelen, E P Smakman, D J Bakker, et al.
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