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Ultramicroscopy|January 1, 1986
Methods for specimen thickness determination in electron microscopy. II. Changes in thickness with doseJ Berriman, K R LeonardUltramicroscopy|January 1, 1986
An algorithm for straightening images of curved filamentous structuresE H EgelmanUltramicroscopy|January 1, 1987
Electron-irradiation-induced flattening of negatively stained 2D protein crystalsJ C Jésior, R H WadeUltramicroscopy|October 13, 2022
Optimal experiment design for element specific atom counting using multiple annular dark field scanning transmission electron microscopy detectorsD G Sentürk, A De Backer, T Friedrich, et al.Ultramicroscopy|September 16, 2022
Large Area, High Resolution Mapping of Approximate Rotational Symmetries in a Pd77.5Cu6Si16.5 Metallic Glass Thin FilmShuoyuan Huang, Carter Francis, John Sunderland, et al.Ultramicroscopy|December 1, 1975
A simple procedure for mounting wrinkle-free sections on formvar-coated slot gridsJ C Rowley, D T MoranUltramicroscopy|December 1, 1994
Restoration of high-tilt electron micrographs using a focus seriesA H Delaney, A BelmontUltramicroscopy|January 1, 1995
The Sayre equation in electron crystallographyD L Dorset, S Kopp, J R Fryer, et al.Ultramicroscopy|November 26, 2023
Accurate magnification determination for cryoEM using goldJoshua L Dickerson, Erin Leahy, Mathew J Peet, et al.Ultramicroscopy|December 6, 2023
Weighted Burgers Vector analysis of orientation fields from high-angular resolution electron backscatter diffractionJoe Gardner, David Wallis, Lars N Hansen, et al.Pageof 460