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Ultramicroscopy|December 2, 2015
Direct in situ thermometry: Variations in reciprocal-lattice vectors and challenges with the Debye-Waller effectDaniel R Cremons, David J FlanniganUltramicroscopy|December 2, 2015
Realization of a tilted reference wave for electron holography by means of a condenser biprismFalk Röder, Florent Houdellier, Thibaud Denneulin, et al.Ultramicroscopy|December 2, 2015
Dopant profiling based on scanning electron and helium ion microscopyAugustus K W Chee, Stuart A BodenUltramicroscopy|December 3, 2015
Performance of a direct detection camera for off-axis electron holographyShery L Y Chang, Christian Dwyer, Juri Barthel, et al.Ultramicroscopy|December 20, 2014
Development of TEM and SEM high brightness electron guns using cold-field emission from a carbon nanotipF Houdellier, L de Knoop, C Gatel, et al.Ultramicroscopy|September 5, 2015
Vibrational-loss EELS and the avoidance of radiation damageR F EgertonUltramicroscopy|September 7, 2015
Introduction and comparison of new EBSD post-processing methodologiesStuart I Wright, Matthew M Nowell, Scott P Lindeman, et al.Ultramicroscopy|October 19, 2015
Differential phase-contrast dark-field electron holography for strain mappingThibaud Denneulin, Florent Houdellier, Martin HÿtchUltramicroscopy|November 2, 2015
Functional extension of high-speed AFM for wider biological applicationsTakayuki Uchihashi, Hiroki Watanabe, Shingo Fukuda, et al.Ultramicroscopy|September 8, 2014
Practical aspects of the use of the X(2) holder for HRTEM-quality TEM sample preparation by FIBWillem van Mierlo, Dorin Geiger, Alan Robins, et al.Pageof 460