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Ultramicroscopy|September 5, 2015
Vibrational-loss EELS and the avoidance of radiation damageR F EgertonUltramicroscopy|September 7, 2015
Introduction and comparison of new EBSD post-processing methodologiesStuart I Wright, Matthew M Nowell, Scott P Lindeman, et al.Ultramicroscopy|October 19, 2015
Differential phase-contrast dark-field electron holography for strain mappingThibaud Denneulin, Florent Houdellier, Martin HÿtchUltramicroscopy|November 2, 2015
Functional extension of high-speed AFM for wider biological applicationsTakayuki Uchihashi, Hiroki Watanabe, Shingo Fukuda, et al.Ultramicroscopy|September 8, 2014
Practical aspects of the use of the X(2) holder for HRTEM-quality TEM sample preparation by FIBWillem van Mierlo, Dorin Geiger, Alan Robins, et al.Ultramicroscopy|September 8, 2014
Comparison of optimal performance at 300keV of three direct electron detectors for use in low dose electron microscopyG McMullan, A R Faruqi, D Clare, et al.Ultramicroscopy|September 8, 2014
Comparison between magnetic force microscopy and electron back-scatter diffraction for ferrite quantification in type 321 stainless steelA D Warren, R L Harniman, A M Collins, et al.Ultramicroscopy|December 3, 2014
Electron imaging with an EBSD detectorStuart I Wright, Matthew M Nowell, René de Kloe, et al.Ultramicroscopy|December 3, 2014
Efficient phase contrast imaging in STEM using a pixelated detector. Part 1: experimental demonstration at atomic resolutionTimothy J Pennycook, Andrew R Lupini, Hao Yang, et al.Pageof 458