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Ultramicroscopy|November 27, 2009
Dynamic behavior of amplitude detection Kelvin force microscopy in ultrahigh vacuumH Diesinger, D Deresmes, J-P Nys, et al.
Ultramicroscopy|December 17, 2009
Analysis of Kikuchi band contrast reversal in electron backscatter diffraction patterns of siliconAimo Winkelmann, Gert Nolze
Ultramicroscopy|December 17, 2009
A framework for automatic segmentation in three dimensions of microstructural tomography dataP S Jørgensen, K V Hansen, R Larsen, et al.
Ultramicroscopy|April 4, 2018
Spherical aberration correction in a scanning transmission electron microscope using a sculpted thin filmRoy Shiloh, Roei Remez, Peng-Han Lu, et al.
Ultramicroscopy|July 10, 2017
High-throughput, semi-automated quantitative STEM mass measurement of supported metal nanoparticles using a conventional TEM/STEMStephen D House, Yuxiang Chen, Rongchao Jin, et al.
Ultramicroscopy|July 4, 2017
An instrumental approach to combining confocal microspectroscopy and 3D scanning probe nanotomographyKonstantin E Mochalov, Anton A Chistyakov, Daria O Solovyeva, et al.
Ultramicroscopy|April 23, 2018
A new method for mapping the three-dimensional atomic distribution within nanoparticles by atom probe tomography (APT)Se-Ho Kim, Phil Woong Kang, O Ok Park, et al.
Ultramicroscopy|April 25, 2018
Demonstration of a 2 × 2 programmable phase plate for electronsJo Verbeeck, Armand Béché, Knut Müller-Caspary, et al.
Ultramicroscopy|June 14, 2018
Introducing a non-pixelated and fast centre of mass detector for differential phase contrast microscopyFelix Schwarzhuber, Peter Melzl, Simon Pöllath, et al.
Ultramicroscopy|June 4, 2018
Lateral position correction in ptychography using the gradient of intensity patternsPriya Dwivedi, A P Konijnenberg, S F Pereira, et al.
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