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Ultramicroscopy|July 4, 2017
An instrumental approach to combining confocal microspectroscopy and 3D scanning probe nanotomographyKonstantin E Mochalov, Anton A Chistyakov, Daria O Solovyeva, et al.Ultramicroscopy|April 23, 2018
A new method for mapping the three-dimensional atomic distribution within nanoparticles by atom probe tomography (APT)Se-Ho Kim, Phil Woong Kang, O Ok Park, et al.Ultramicroscopy|April 25, 2018
Demonstration of a 2 × 2 programmable phase plate for electronsJo Verbeeck, Armand Béché, Knut Müller-Caspary, et al.Ultramicroscopy|June 14, 2018
Introducing a non-pixelated and fast centre of mass detector for differential phase contrast microscopyFelix Schwarzhuber, Peter Melzl, Simon Pöllath, et al.Ultramicroscopy|June 4, 2018
Lateral position correction in ptychography using the gradient of intensity patternsPriya Dwivedi, A P Konijnenberg, S F Pereira, et al.Ultramicroscopy|February 14, 2015
A proposal for the holographic correction of incoherent aberrations by tilted reference wavesFalk Röder, Axel LubkUltramicroscopy|February 21, 2015
Nanostructure characterisation of flow-formed Cr-Mo-V steel using transmission Kikuchi diffraction techniqueS Birosca, R Ding, S Ooi, et al.Ultramicroscopy|February 7, 2015
In quest of perfection in electron optics: a biographical sketch of Harald Rose on the occasion of his 80th birthdayKnut W UrbanUltramicroscopy|August 16, 2020
Local thickness and composition measurements from scanning convergent-beam electron diffraction of a binary non-crystalline material obtained by a pixelated detectorK Nakazawa, K Mitsuishi, K Shibata, et al.Ultramicroscopy|February 28, 2015
Combining structural and chemical information at the nanometer scale by correlative transmission electron microscopy and atom probe tomographyM Herbig, P Choi, D RaabePageof 458