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Ultramicroscopy|June 28, 2023
Perimeter procedure to produce average equivalent area grain sizeWei-Jie Qiu, Xuan-Wei Lei, Yu Zhang, et al.Ultramicroscopy|February 8, 2024
Energy-dispersive X-ray spectroscopy in a low energy electron microscopeRudolf M TrompUltramicroscopy|February 4, 2024
Correction of step size dependency in local misorientation obtained by EBSD measurements: Introducing equidistant local misorientationMasayuki KamayaUltramicroscopy|February 15, 2024
Fast detection of micro-objects using scanning electrochemical microscopy based on visual recognition and machine learningVadimas Ivinskij, Antanas Zinovicius, Andrius Dzedzickis, et al.Ultramicroscopy|August 2, 2023
Non-contact non-resonant atomic force microscopy method for measurements of highly mobile molecules and nanoparticlesEgor Ukraintsev, Bohuslav RezekUltramicroscopy|August 3, 2023
Positioning and atomic imaging of micron-size graphene sheets by a scanning tunneling microscopeTao Geng, Jihao Wang, Wenjie Meng, et al.Ultramicroscopy|July 27, 2023
Fast reconstruction of scanning transmission electron microscopy images using Markov random field modelTaichi Kusumi, Shun Katakami, Ryo Ishikawa, et al.Ultramicroscopy|July 27, 2023
Quantifying noise limitations of neural network segmentations in high-resolution transmission electron microscopyMatthew Helmi Leth Larsen, William Bang Lomholdt, Cuauhtemoc Nuñez Valencia, et al.Ultramicroscopy|August 6, 2023
Back illuminated photo emission electron microscopy (BIPEEM)Amin Moradi, Matthijs Rog, Guido Stam, et al.Ultramicroscopy|August 6, 2023
Four-dimensional electron energy-loss spectroscopyMei Wu, Ruochen Shi, Ruishi Qi, et al.Pageof 460