Four-dimensional electron energy-loss spectroscopy

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Updated: Jul 20, 2025

Photoelectron Imaging of Anions Illustrated by 310 Nm Detachment of F−
06:53

Photoelectron Imaging of Anions Illustrated by 310 Nm Detachment of F−

Published on: July 27, 2018

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Mei Wu1, Ruochen Shi1, Ruishi Qi2

  • 1International Center for Quantum Materials, Peking University, Beijing 100871, China; Electron Microscopy Laboratory, School of Physics, Peking University, Beijing 100871, China.

Ultramicroscopy
|August 6, 2023
PubMed

Keywords:
Defect scatteringFour-dimensional electron energy-loss spectroscopy (4D-EELS)Phonon dispersionScanning transmission electron microscopy (STEM)

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