Electron Microscopy Measurement of Picometer-Level Distortion Induced Local Phonons at a Defect

Bo Han1,2, Ruochen Shi1,2, Huining Peng3

  • 1International Center for Quantum Materials, School of Physics, Peking University, Beijing 100871, China.

Nano Letters
|January 20, 2026
PubMed
Abstract

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