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Ultramicroscopy|February 24, 2012
Minimizing tip-sample forces in jumping mode atomic force microscopy in liquidA Ortega-Esteban, I Horcas, M Hernando-Pérez, et al.Ultramicroscopy|April 2, 2013
Laboratory-based real and reciprocal space imaging of the electronic structure of few layer graphene on SiC(0001¯) using photoelectron emission microscopyN Barrett, K Winkler, B Krömker, et al.Ultramicroscopy|April 3, 2013
Measurement of spatial coherence of electron beams by using a small selected-area apertureShigeyuki Morishita, Jun Yamasaki, Nobuo TanakaUltramicroscopy|April 4, 2013
Comparison of approaches and artefacts in the measurement of detector modulation transfer functionsC B Boothroyd, T Kasama, R E Dunin-BorkowskiUltramicroscopy|April 24, 2013
In-situ SEM microchip setup for electrochemical experiments with water based solutionsE Jensen, C Købler, P S Jensen, et al.Ultramicroscopy|June 4, 2013
A distinguished trio, introduction to the Saxton-Smith-Van Dyck 65th-birthday issueP W HawkesUltramicroscopy|May 16, 2013
Strain measurement at the nanoscale: Comparison between convergent beam electron diffraction, nano-beam electron diffraction, high resolution imaging and dark field electron holographyA Béché, J L Rouvière, J P Barnes, et al.Ultramicroscopy|April 11, 2013
LEEM image phase contrast of MnAs stripesA B Pang, A Pavlovska, L Däweritz, et al.Ultramicroscopy|March 30, 2013
Mapping energetics of atom probe evaporation events through first principles calculationsJoaquín Peralta, Scott R Broderick, Krishna RajanUltramicroscopy|July 23, 2013
Quantitative electron tomography: the effect of the three-dimensional point spread functionHamed Heidari, Wouter Van den Broek, Sara BalsPageof 460