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Ultramicroscopy|August 29, 2014
Multi-actuation and PI control: a simple recipe for high-speed and large-range atomic force microscopyI Soltani Bozchalooi, K Youcef-ToumiUltramicroscopy|August 25, 2014
Characterization of fast photoelectron packets in weak and strong laser fields in ultrafast electron microscopyDayne A Plemmons, Sang Tae Park, Ahmed H Zewail, et al.Ultramicroscopy|March 26, 2013
Effect of external stress on the Fe-Cr phase separation in 15-5 PH and Fe-15Cr-5Ni alloysF Danoix, J Lacaze, A Gibert, et al.Ultramicroscopy|September 9, 2015
Mapping interfacial excess in atom probe dataPeter Felfer, Barbara Scherrer, Jelle Demeulemeester, et al.Ultramicroscopy|September 7, 2015
Effects of detector dead-time on quantitative analyses involving boron and multi-hit detection events in atom probe tomographyFrederick Meisenkothen, Eric B Steel, Ty J Prosa, et al.Ultramicroscopy|January 19, 2016
Electron Energy Loss Spectroscopy imaging of surface plasmons at the nanometer scaleChristian Colliex, Mathieu Kociak, Odile StéphanUltramicroscopy|December 22, 2015
Advancing FIB assisted 3D EBSD using a static sample setupJulien Guyon, Nathalie Gey, Daniel Goran, et al.Ultramicroscopy|January 1, 2016
Tip characterization method using multi-feature characterizer for CD-AFMNdubuisi G Orji, Hiroshi Itoh, Chumei Wang, et al.Ultramicroscopy|March 25, 2016
Classification using diffraction patterns for single-particle analysisHongli Hu, Kaiming Zhang, Xing MengPageof 460