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Ultramicroscopy|November 8, 2024
Beyond the random phase approximation (RPA): First principles calculation of the valence EELS spectrum for KBr including local field, quasiparticle, excitonic and spin orbit coupling effectsV J Keast
Ultramicroscopy|November 5, 2024
On the instrument-dependent appearance of ion dissociation events in atom probe tomography mass spectraBenjamin W Caplins, Ann N Chiaramonti, Jacob M Garcia, et al.
Ultramicroscopy|November 4, 2024
Role of slice thickness quantification in the 3D reconstruction of FIB tomography data of nanoporous materialsTrushal Sardhara, Alexander Shkurmanov, Yong Li, et al.
Ultramicroscopy|November 14, 2025
Development of precession Lorentz transmission electron microscopyShunsuke Hayashi, Dongxue Han, Hidenori Tsuji, et al.
Ultramicroscopy|November 15, 2025
Secondary electron topographical contrast formation in scanning transmission electron microscopyEvgenii Vlasov, Wouter Heyvaert, Tom Stoops, et al.
Ultramicroscopy|November 7, 2025
Evaporated amorphous Si protective coatings for dual FIB/SEM preparation of high-quality lamellae for S/TEM analysisN G Rudawski, M A Downing
Ultramicroscopy|November 1, 2025
Ultralow-temperature cryogenic transmission electron microscopy using a new helium flow cryostat stageYoung-Hoon Kim, Fehmi Sami Yasin, Na Yeon Kim, et al.
Ultramicroscopy|November 1, 2025
Detecting Magnon-phonon coupling in yttrium iron garnet with variable temperature STEM-EELSAlexander Reifsnyder, Mohamed Nawwar, Minyue Zhu, et al.
Ultramicroscopy|October 14, 2025
Polarimetric interferometer with attosecond stability for time-resolved pump-probe photoemission microscopyAlexander Neuhaus, David Janoschka, Yannik Paul, et al.
Ultramicroscopy|September 23, 2025
ETDMS: Efficient two-stage diffusion model for accelerated SEM image super-resolutionXuecheng Zhang, Zixin Li, Bin Zhang, et al.
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