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Ultramicroscopy|December 8, 2020
Atomically resolved tomographic reconstruction of nanoparticles from single projection: Influence of amorphous carbon supportPritam Banerjee, Chiranjit Roy, Subhra Kanti De, et al.Ultramicroscopy|December 8, 2020
TrueEBSD: Correcting spatial distortions in electron backscatter diffraction mapsVivian S Tong, T Ben BrittonUltramicroscopy|December 8, 2020
Implementation and operation of a fiber-coupled CMOS detector in a low energy electron MicroscopeD Janoschka, P Dreher, A Rödl, et al.Ultramicroscopy|November 30, 2018
Using transmission Kikuchi diffraction in a scanning electron microscope to quantify geometrically necessary dislocation density at the nanoscaleX Z Liang, M F Dodge, J Jiang, et al.Ultramicroscopy|November 30, 2018
Moiré structures in twisted bilayer graphene studied by transmission electron microscopyTatiana Latychevskaia, Conrad Escher, Hans-Werner FinkUltramicroscopy|December 30, 2017
Analyzing the channel dopant profile in next-generation FinFETs via atom probe tomographyAndrew J Martin, Yong Wei, Andreas ScholzeUltramicroscopy|December 9, 2021
A precision manual grinding tool for sample preparationLawrence WhitmoreUltramicroscopy|January 19, 2022
Stress effect on the resonance properties of single-crystal diamond cantilever resonators for microscopy applicationsXiulin Shen, Zhenfei Lv, Kimiyoshi Ichikawa, et al.Ultramicroscopy|March 23, 2021
Application of electron tomography for comprehensive determination of III-V interface propertiesLars Nicolai, Klaus Biermann, Achim TrampertUltramicroscopy|December 25, 2021
In search of best automated model: Explaining nanoparticle TEM image segmentationKunwar Muhammed Saaim, Saima Khan Afridi, Maryam Nisar, et al.Pageof 460