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Related Concept Videos

X-ray Crystallography02:18

X-ray Crystallography

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The size of the unit cell and the arrangement of atoms in a crystal may be determined from measurements of the diffraction of X-rays by the crystal, termed X-ray crystallography.
Diffraction
Diffraction is the change in the direction of travel experienced by an electromagnetic wave when it encounters a physical barrier whose dimensions are comparable to those of the wavelength of the light. X-rays are electromagnetic radiation with wavelengths about as long as the distance between neighboring...
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Related Experiment Video

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Synchrotron X-ray Microdiffraction and Fluorescence Imaging of Mineral and Rock Samples
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TrueEBSD: Correcting spatial distortions in electron backscatter diffraction maps.

Vivian S Tong1, T Ben Britton1

  • 1Department of Materials, Imperial College London, Exhibition Road, London, SW7 2AZ, United Kingdom.

Ultramicroscopy
|December 8, 2020
PubMed
Summary
This summary is machine-generated.

TrueEBSD corrects distortions in electron backscatter diffraction (EBSD) data, improving microstructure mapping. This automated postprocessing enhances the characterization of polycrystalline materials like titanium and zirconium.

Keywords:
Computer softwareCorrelative microscopyImage processingScanning probe microscopyTemplate matching

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Area of Science:

  • Materials Science
  • Metallurgy
  • Microscopy

Background:

  • Electron backscatter diffraction (EBSD) is vital for microstructural analysis of polycrystalline materials.
  • Standard EBSD data acquisition at high tilt and slow speeds introduces tilt and drift distortions.
  • These distortions obscure critical microstructural features in the final maps.

Purpose of the Study:

  • To introduce TrueEBSD, an automated postprocessing technique for precise distortion correction in EBSD data.
  • To enable accurate characterization of microstructural features previously hidden by distortions.
  • To improve the reliability and detail of EBSD microstructure maps.

Main Methods:

  • Developed an automatic postprocessing procedure named TrueEBSD.
  • Utilized intermediate images to isolate tilt and drift distortion components.
  • Applied a physically-informed distortion model for accurate correction at pixel-scale precision.

Main Results:

  • Successfully demonstrated TrueEBSD on titanium, zirconium, and hydride-containing zirconium samples.
  • Achieved significant removal of tilt and drift distortions.
  • Enabled the detailed characterization of previously inaccessible microstructural features.

Conclusions:

  • TrueEBSD provides a robust solution for correcting distortions in EBSD data.
  • The method significantly enhances the quality and interpretability of microstructure maps.
  • This advancement facilitates deeper understanding of material behavior and properties.