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Ultramicroscopy|May 16, 2015
Determination of three-dimensional strain state in crystals using self-interfered split HOLZ linesRodney Herring, Mana Norouzpour, Koh Saitoh, et al.
Ultramicroscopy|June 13, 2015
Tunable caustic phenomena in electron wavefieldsAmir Hossein Tavabi, Vadim Migunov, Christian Dwyer, et al.
Ultramicroscopy|May 11, 2015
The effect of pattern overlap on the accuracy of high resolution electron backscatter diffraction measurementsVivian Tong, Jun Jiang, Angus J Wilkinson, et al.
Ultramicroscopy|June 8, 2020
Aberration corrected spin polarized low energy electron microscopeLei Yu, Weishi Wan, Takanori Koshikawa, et al.
Ultramicroscopy|May 23, 2020
A general and robust analytical method for interface normal determination in TEMRui-Xun Xie, Melvyn Larranaga, Frédéric Mompiou, et al.
Ultramicroscopy|May 26, 2020
Quantitative Analysis Method for Nitrogen Electron Energy-Loss Near-Edge Structures in Nanocarbons Based on Density Functional Theory Calculations and Linear RegressionJunnan Chen, Xueping Quan, Ming Lu, et al.
Ultramicroscopy|May 4, 2020
Unravelling new principles of site-selective doping contrast in the dual-beam focused ion beam/scanning electron microscopeAugustus K W Chee
Ultramicroscopy|September 17, 2021
Brightness evaluation of pulsed electron gun using negative electron affinity photocathode developed for time-resolved measurement using scanning electron microscopeHideo Morishita, Takashi Ohshima, Kazuo Otsuga, et al.
Ultramicroscopy|May 15, 2020
Combining high temperature sample preparation and in-situ magnetic fields in XPEEMAnna Mandziak, Juan de la Figuera, Jose Emilio Prieto, et al.
Ultramicroscopy|May 15, 2020
Using Cˇerenkov radiation for measuring the refractive index in thick samples by interferometric cathodoluminescenceMichael Stöger-Pollach, Stefan Löffler, Niklas Maurer, et al.
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