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Ultramicroscopy|May 11, 2020
Modeling and correction of image pixel hysteresis in atomic force microscopyBaishun Sun, Liang Cao, Zhengcheng Lu, et al.Ultramicroscopy|May 1, 2021
Evaluation of electron radiation damage to green fluorescent proteinH Ikegami, K Akiba, H MinodaUltramicroscopy|June 11, 2020
Imaging Polarity in Two Dimensional Materials by Breaking Friedel's LawPratiti Deb, Michael C Cao, Yimo Han, et al.Ultramicroscopy|September 7, 2021
Demonstration of atomic force microscopy imaging using an integrated opto-electro-mechanical transducerFederico Galeotti, Gustav Lindgren, Maurangelo Petruzzella, et al.Ultramicroscopy|February 8, 2005
Phase recovery for electron holography using Gerchberg-Papoulis iterative algorithmTakeshi Fujita, M R McCartneyUltramicroscopy|February 8, 2005
Independent component analysis: a new possibility for analysing series of electron energy loss spectraNoël Bonnet, Danielle NuzillardUltramicroscopy|September 27, 2005
Microarrays of near-field optical probes with adjustable dimensionsA Chovin, P Garrigue, G Pecastaings, et al.Ultramicroscopy|March 19, 2005
A multi-wall carbon nanotube (MWCNT) relocation technique for atomic force microscopy (AFM) samplesYongzhi Cao, Yingchun Liang, Shen Dong, et al.Ultramicroscopy|March 19, 2005
Advances in the segmentation of multi-component microanalytical imagesJérôme Cutrona, Noël Bonnet, Michel Herbin, et al.Pageof 460