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Ultramicroscopy|March 22, 2005
Analysis of local orientation gradients in deformed single crystalsD P Field, P B Trivedi, S I Wright, et al.Ultramicroscopy|November 24, 2004
Automated spatial drift correction for EFTEM image seriesBernhard Schaffer, Werner Grogger, Gerald KothleitnerUltramicroscopy|December 14, 2004
Vibration sensitivity of the scanning near-field optical microscope with a tapered optical fiber probeWin-Jin Chang, Te-Hua Fang, Haw-Long Lee, et al.Ultramicroscopy|May 6, 2006
Effect of cholesterol on the physical properties of pulmonary surfactant films: atomic force measurements studyZoya Leonenko, Eric Finot, Vladislav Vassiliev, et al.Ultramicroscopy|May 6, 2006
Improving the contrast of topographical AFM images by a simple averaging filterF Kienberger, V P Pastushenko, G Kada, et al.Ultramicroscopy|May 6, 2006
AFM studies of environmental effects on nanomechanical properties and cellular structure of human hairBharat Bhushan, Nianhuan ChenUltramicroscopy|July 28, 2006
Characterizing probe performance in the aberration corrected STEMP E BatsonUltramicroscopy|July 29, 2006
Quantitative secondary electron energy filtering in a scanning electron microscope and its applicationsP Kazemian, S A M Mentink, C Rodenburg, et al.Ultramicroscopy|July 29, 2006
EFTEM spectrum imaging at high-energy resolutionBernhard Schaffer, Gerald Kothleitner, Werner GroggerUltramicroscopy|July 29, 2006
Digitisation of electron microscope films: six useful tests applied to three film scannersR Henderson, D Cattermole, G McMullan, et al.Pageof 460