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Ultramicroscopy|June 7, 2005
Extended defect related energy loss in CVD diamond revealed by spectrum imaging in a dedicated STEMU Bangert, A J Harvey, M Schreck, et al.
Ultramicroscopy|June 7, 2005
On the peculiarities of CBED pattern formation revealed by multislice simulationA Chuvilin, U Kaiser
Ultramicroscopy|July 27, 2006
Site-specific electronic structure analysis by channeling EELS and first-principles calculationsKazuyoshi Tatsumi, Shunsuke Muto, Yu Yamamoto, et al.
Ultramicroscopy|July 27, 2006
Subtleties in ADF imaging and spatially resolved EELS: A case study of low-angle twist boundaries in SrTiO3L Fitting, S Thiel, A Schmehl, et al.
Ultramicroscopy|July 28, 2006
Soft-X-ray emission spectroscopy based on TEM-Toward a total electronic structure analysisMasami Terauchi, Masanao Kawana
Ultramicroscopy|August 26, 2006
When structural noise is the signal: speckle statistics in fluctuation electron microscopyM M J Treacy
Ultramicroscopy|September 20, 2006
Energy dissipation and dynamic response of an amplitude-modulation atomic-force microscopy subjected to a tip-sample viscous forceShueei Muh Lin
Ultramicroscopy|May 14, 2005
Active pixel sensor array as a detector for electron microscopyAnna-Clare Milazzo, Philippe Leblanc, Fred Duttweiler, et al.
Ultramicroscopy|September 3, 2005
Ab initio determination of the framework structure of the heavy-metal oxide Cs(x)Nb2.54W2.46O14 from 100 kV precession electron diffraction dataThomas E Weirich, Joaquim Portillo, Gerhard Cox, et al.
Ultramicroscopy|July 30, 2005
Highly sensitive polymer-based cantilever-sensors for DNA detectionM Calleja, M Nordström, M Alvarez, et al.
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