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Ultramicroscopy|May 28, 2019
Correction of parasitic aberrations of hexapole corrector using differential algebra methodTomáš RadličkaUltramicroscopy|September 30, 2018
Application of a novel compact Cs evaporator prototype for enhancing negative ion yields during FIB-TOF-SIMS analysis in high vacuumAgnieszka Priebe, Johann MichlerUltramicroscopy|May 22, 2019
Phase retrieval with extended field of view based on continuous phase modulationXingchen Pan, Cheng Liu, Jianqiang ZhuUltramicroscopy|May 5, 2019
High contrast STEM imaging for light elements by an annular segmented detectorKousuke Ooe, Takehito Seki, Yuichi Ikuhara, et al.Ultramicroscopy|April 3, 2022
Imaging biological macromolecules in thick specimens: The role of inelastic scattering in cryoEMJoshua L Dickerson, Peng-Han Lu, Dilyan Hristov, et al.Ultramicroscopy|March 15, 2022
AutoDisk: Automated diffraction processing and strain mapping in 4D-STEMSihan Wang, Tim B Eldred, Jacob G Smith, et al.Ultramicroscopy|August 26, 1999
Gallium replication in aquatic and nonaquatic organism scanning electron microscopyE AdachiUltramicroscopy|July 16, 1999
Leginon: a system for fully automated acquisition of 1000 electron micrographs a dayC S Potter, H Chu, B Frey, et al.Ultramicroscopy|September 12, 2000
Diffusion anisotropy of Ag and In on Si(1 1 1) surface studied by UHV-SEMShi, Shiraki, Nagao, et al.Ultramicroscopy|September 12, 2000
Hologram simulation for off-axis electron holographyYamamoto, Tanji, HibinoPageof 460