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Ultramicroscopy|April 3, 2001
Core-hole effects on energy-loss near-edge structureG Duscher, R Buczko, S J Pennycook, et al.Ultramicroscopy|February 24, 2001
Analysis of protein crystal growth at molecular resolution by atomic force microscopyM Wiechmann, O Enders, C Zeilinger, et al.Ultramicroscopy|February 24, 2001
Measuring magnetic susceptibilities of nanogram quantities of materials using microcantileversE Finot, T Thundat, E Lesniewska, et al.Ultramicroscopy|April 20, 2001
High-angle annular dark-field imaging of self-assembled Ge islands on Si(0 0 1)C P Liu, R D Twesten, J M GibsonUltramicroscopy|June 23, 2001
Spatial resolution and energy filtering of backscattered electron images in scanning electron microscopyP G Merli, A Migliori, V Morandi, et al.Ultramicroscopy|June 23, 2001
A high-resolution serial sectioning specimen preparation technique for application to electron backscatter diffractionM A Wall, A J Schwartz, L NguyenUltramicroscopy|September 8, 2001
Transmission electron microscopy with Zernike phase plateR Danev, K NagayamaUltramicroscopy|January 17, 2002
Calculation of the electronic structure of carbon films using electron energy loss spectroscopyI Alexandro, A J Papworth, B Rafferty, et al.Ultramicroscopy|January 17, 2002
Inverse electronic scattering by singular values decomposition within the Fresnel-Kirchhoff formalismA MayerUltramicroscopy|September 15, 2019
Design for a 10 keV multi-pass transmission electron microscopeStewart A Koppell, Marian Mankos, Adam J Bowman, et al.Pageof 460