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Ultramicroscopy|July 12, 2011
Scanning transmission electron microscopy imaging dynamics at low accelerating voltagesN R Lugg, S D Findlay, N Shibata, et al.Ultramicroscopy|July 12, 2011
Imaging with low-voltage scanning transmission electron microscopy: a quantitative analysisL Felisari, V Grillo, F Jabeen, et al.Ultramicroscopy|July 12, 2011
Gallium-enhanced phase contrast in atom probe tomography of nanocrystalline and amorphous Al-Mn alloysShiyun Ruan, Karen L Torres, Gregory B Thompson, et al.Ultramicroscopy|July 12, 2011
Three dimensional atom probe imaging of GaAsSb quantum ringsA M Beltrán, E A Marquis, A G Taboada, et al.Ultramicroscopy|July 12, 2011
High-angle triple-axis specimen holder for three-dimensional diffraction contrast imaging in transmission electron microscopyS Hata, H Miyazaki, S Miyazaki, et al.Ultramicroscopy|March 27, 2007
Analysis of nano-chemical mapping performed by an AFM-based ("AFMIR") acousto-optic techniqueA Dazzi, R Prazeres, F Glotin, et al.Ultramicroscopy|March 27, 2007
Microstructure of a newly developed gamma' strengthened Co-base superalloyD H Ping, C Y Cui, Y F Gu, et al.Ultramicroscopy|March 30, 2007
Solid state reaction in sandwich-type Al/Cu thin filmsConstantin-Buzau Ene, Guido Schmitz, Talaat Al-Kassab, et al.Ultramicroscopy|March 30, 2007
The Peak Pairs algorithm for strain mapping from HRTEM imagesPedro L Galindo, Sławomir Kret, Ana M Sanchez, et al.Ultramicroscopy|June 15, 2007
STM observation of a single diarylethene flickeringN Battaglini, H Klein, C Hortholary, et al.Pageof 460