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Ultramicroscopy|February 21, 2012
Experimental evaluation of interfaces using atomic-resolution high angle annular dark field (HAADF) imagingPaul D Robb, Michael Finnie, Paolo Longo, et al.Ultramicroscopy|January 3, 2012
A Contrast Transfer Function approach for image calculations in standard and aberration-corrected LEEM and PEEMS M Schramm, A B Pang, M S Altman, et al.Ultramicroscopy|August 26, 2011
Toward quantitative core-loss EFTEM tomographyN Y Jin-Phillipp, C T Koch, P A van AkenUltramicroscopy|August 26, 2011
Ion beam nanopatterning and micro-Raman spectroscopy analysis on HOPG for testing FIB performancesB S Archanjo, I O Maciel, E H Martins Ferreira, et al.Ultramicroscopy|August 26, 2011
A method to determine the local surface profile from reconstructed exit wavesA Wang, F R Chen, S Van Aert, et al.Ultramicroscopy|August 26, 2011
A study of phase separated Ni66Nb17Y17 metallic glass using atom probe tomographyA Shariq, N MatternUltramicroscopy|August 26, 2011
High energy-resolution electron energy-loss spectroscopy study of the dielectric properties of bulk and nanoparticle LaB6 in the near-infrared regionYohei Sato, Masami Terauchi, Masaki Mukai, et al.Ultramicroscopy|September 24, 2011
On the optimum probe in aberration corrected ADF-STEMEarl J KirklandUltramicroscopy|September 23, 2011
The effect of vacancies on the annular dark field image contrast of grain boundaries: a SrTiO(3) case studyH-S Lee, S D Findlay, T Mizoguchi, et al.Ultramicroscopy|September 21, 2011
Effect of microscopic parameters on EBSD spatial resolutionDelphic Chen, Jui-Chao Kuo, Wen-Tuan WuPageof 460