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Ultramicroscopy|September 24, 2011
Coherent microscopy by laser optical feedback imaging (LOFI) techniqueO Hugon, F Joud, E Lacot, et al.
Ultramicroscopy|February 28, 2012
High resolution electron backscatter diffraction measurements of elastic strain variations in the presence of larger lattice rotationsT B Britton, A J Wilkinson
Ultramicroscopy|June 7, 2012
A pattern recognition technique for the analysis of grain boundary structure by HREMS Paciornik, R Kilaas, J Turner, et al.
Ultramicroscopy|June 7, 2012
On the many advantages of local-electrode atom probesT F Kelly, P P Camus, D J Larson, et al.
Ultramicroscopy|June 7, 2012
Stacked bilayer helices: a new structural organization of amphiphilic moleculesC Boettcher, H Stark, M van Heel
Ultramicroscopy|July 1, 2017
Axial geometrical aberration correction up to 5th order with N-SYLCShahedul Hoque, Hiroyuki Ito, Akio Takaoka, et al.
Ultramicroscopy|July 1, 2017
Development of laser-based scanning µ-ARPES system with ultimate energy and momentum resolutionsHideaki Iwasawa, Eike F Schwier, Masashi Arita, et al.
Ultramicroscopy|December 14, 2005
Electron holography of thin amorphous carbon films: measurement of the mean inner potential and a thickness-independent phase shiftMatthias Wanner, David Bach, Dagmar Gerthsen, et al.
Ultramicroscopy|August 10, 2018
On the effect of local sample slope during modulus measurements by contact-resonance atomic force microscopyK Heinze, O Arnould, J-Y Delenne, et al.
Ultramicroscopy|August 10, 2018
A method for site-specific and cryogenic specimen fabrication of liquid/solid interfaces for atom probe tomographyD K Schreiber, D E Perea, J V Ryan, et al.
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