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Ultramicroscopy|November 3, 2017
Si amorphization by focused ion beam milling: Point defect model with dynamic BCA simulation and experimental validationJ Huang, M Loeffler, U Muehle, et al.Ultramicroscopy|October 3, 2017
Mapping buried nanostructures using subsurface ultrasonic resonance force microscopyMaarten H van Es, Abbas Mohtashami, Rutger M T Thijssen, et al.Ultramicroscopy|October 13, 2017
Zernike phase contrast in high-energy x-ray transmission microscopy based on refractive opticsKen Vidar Falch, Mikhail Lyubomirsky, Daniele Casari, et al.Ultramicroscopy|March 30, 2018
Finite element modeling of trolling-mode AFMMohammadreza Sajjadi, Hossein Nejat Pishkenari, Gholamreza VossoughiUltramicroscopy|March 31, 2018
Structure and chemistry of interfaces between ceria and yttria-stabilized zirconia studied by analytical STEMH Schmid, E Gilardi, G Gregori, et al.Ultramicroscopy|March 16, 2018
Development of a SEM-based low-energy in-line electron holography microscope for individual particle imagingHidehito Adaniya, Martin Cheung, Cathal Cassidy, et al.Ultramicroscopy|February 12, 2018
Energy-weighted dynamical scattering simulations of electron diffraction modalities in the scanning electron microscopeElena Pascal, Saransh Singh, Patrick G Callahan, et al.Ultramicroscopy|December 11, 2017
Fine electron biprism on a Si-on-insulator chip for off-axis electron holographyMartial Duchamp, Olivier Girard, Giulio Pozzi, et al.Ultramicroscopy|September 5, 2017
Estimating the effect of finite depth of field in single-particle cryo-EMKenneth H Downing, Robert M GlaeserUltramicroscopy|December 4, 2018
Disentangling topographic contributions to near-field scanning microwave microscopy imagesK J Coakley, S Berweger, T M Wallis, et al.Pageof 460