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Ultramicroscopy

Showing results (271-280 of 4,742) with videos related to

Pageof 475
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Ultramicroscopy|March 31, 2000
Optimal sensitivity for molecular recognition MAC-mode AFMSchindler, Badt, Hinterdorfer, et al.
Ultramicroscopy|April 27, 2000
Successive approximations for charged particle motionHoffstaetter
Ultramicroscopy|April 27, 2000
Upper limits for the residual aberrations of a high-resolution aberration-corrected STEMHaider, Uhlemann, Zach
Ultramicroscopy|April 27, 2000
Investigation of thermoelectric silicide thin films by means of analytical transmission electron microscopyHofman, Kleint, Thomas, et al.
Ultramicroscopy|November 9, 2000
Parameters affecting specimen flatness of two-dimensional crystals for electron crystallographyJ Vonck
Ultramicroscopy|January 17, 2002
Thermal enhancement of AFM phase contrast for imaging diblock copolymer thin film morphologyM J Fasolk, A M Mayes, N Magonov
Ultramicroscopy|November 3, 2017
Application of the pattern matching approach for EBSD calibration and orientation mapping, utilising dynamical EBSP simulationsT Friedrich, A Bochmann, J Dinger, et al.
Ultramicroscopy|November 3, 2017
Si amorphization by focused ion beam milling: Point defect model with dynamic BCA simulation and experimental validationJ Huang, M Loeffler, U Muehle, et al.
Ultramicroscopy|October 3, 2017
Mapping buried nanostructures using subsurface ultrasonic resonance force microscopyMaarten H van Es, Abbas Mohtashami, Rutger M T Thijssen, et al.
Ultramicroscopy|October 13, 2017
Zernike phase contrast in high-energy x-ray transmission microscopy based on refractive opticsKen Vidar Falch, Mikhail Lyubomirsky, Daniele Casari, et al.
Pageof 475

Showing results (271-280 of 4,742) with videos related to

Sort By:
Pageof 475
Ultramicroscopy|March 31, 2000
Optimal sensitivity for molecular recognition MAC-mode AFMSchindler, Badt, Hinterdorfer, et al.
Ultramicroscopy|April 27, 2000
Successive approximations for charged particle motionHoffstaetter
Ultramicroscopy|April 27, 2000
Upper limits for the residual aberrations of a high-resolution aberration-corrected STEMHaider, Uhlemann, Zach
Ultramicroscopy|April 27, 2000
Investigation of thermoelectric silicide thin films by means of analytical transmission electron microscopyHofman, Kleint, Thomas, et al.
Ultramicroscopy|November 9, 2000
Parameters affecting specimen flatness of two-dimensional crystals for electron crystallographyJ Vonck
Ultramicroscopy|January 17, 2002
Thermal enhancement of AFM phase contrast for imaging diblock copolymer thin film morphologyM J Fasolk, A M Mayes, N Magonov
Ultramicroscopy|November 3, 2017
Application of the pattern matching approach for EBSD calibration and orientation mapping, utilising dynamical EBSP simulationsT Friedrich, A Bochmann, J Dinger, et al.
Ultramicroscopy|November 3, 2017
Si amorphization by focused ion beam milling: Point defect model with dynamic BCA simulation and experimental validationJ Huang, M Loeffler, U Muehle, et al.
Ultramicroscopy|October 3, 2017
Mapping buried nanostructures using subsurface ultrasonic resonance force microscopyMaarten H van Es, Abbas Mohtashami, Rutger M T Thijssen, et al.
Ultramicroscopy|October 13, 2017
Zernike phase contrast in high-energy x-ray transmission microscopy based on refractive opticsKen Vidar Falch, Mikhail Lyubomirsky, Daniele Casari, et al.
Pageof 475