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Ultramicroscopy|August 31, 2015
Development of splitting convergent beam electron diffraction (SCBED)Florent Houdellier, Falk Röder, Etienne SnoeckUltramicroscopy|September 2, 2015
Determination of the incommensurate modulated structure of Bi(2)Sr(1.6)La(0.4)CuO(6+δ) by aberration-corrected transmission electron microscopyBinghui Ge, Yumei Wang, Huiqian Luo, et al.Ultramicroscopy|September 28, 2015
A phantom-based forward projection approach in support of model-based iterative reconstructions for HAADF-STEM tomographyS V Venkatakrishnan, L F Drummy, M A Jackson, et al.Ultramicroscopy|August 2, 2015
A scanning microscopy technique based on capacitive coupling with a field-effect transistor integrated with the tipKumjae Shin, Dae sil Kang, Sang hoon Lee, et al.Ultramicroscopy|August 2, 2017
Feedforward neural network methodology to characterize thin films by Electrostatic Force MicroscopyM Konomi, G M SachaUltramicroscopy|August 7, 2017
Imaging the potential distribution of individual charged impurities on graphene by low-energy electron holographyTatiana Latychevskaia, Flavio Wicki, Conrad Escher, et al.Ultramicroscopy|June 6, 2016
Denoising time-resolved microscopy image sequences with singular value thresholdingTom Furnival, Rowan K Leary, Paul A MidgleyUltramicroscopy|December 3, 2015
Spherical aberration correction with threefold symmetric line currentsShahedul Hoque, Hiroyuki Ito, Ryuji Nishi, et al.Ultramicroscopy|December 2, 2015
Orientation mapping by transmission-SEM with an on-axis detectorJ J Fundenberger, E Bouzy, D Goran, et al.Ultramicroscopy|December 15, 2015
Cross-sectional atom probe tomography sample preparation for improved analysis of fins on SOIAndrew J Martin, Weihao Weng, Zhengmao Zhu, et al.Pageof 460