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Ultramicroscopy|January 16, 2007
Structure solution with three-dimensional sets of precessed electron diffraction intensitiesMauro Gemmi, Stavros NicolopoulosUltramicroscopy|July 24, 2007
An integrated methodology for data processing in dynamic force spectroscopy of ligand-receptor bindingM Odorico, J-M Teulon, O Berthoumieu, et al.Ultramicroscopy|May 19, 2007
Imaging of radiation-sensitive samples in transmission electron microscopes equipped with Zernike phase platesMarek Malac, Marco Beleggia, Ray Egerton, et al.Ultramicroscopy|June 9, 2007
Morphology, mechanical properties and viability of encapsulated cellsT Svaldo-Lanero, S Krol, R Magrassi, et al.Ultramicroscopy|June 5, 2007
Electric force microscopy investigation of a MEH-PPV conjugated polymer blend: robustness or frailty?P S O Patrício, L A Cury, G G Silva, et al.Ultramicroscopy|June 5, 2007
Preparation of biomolecule gel matrices for electron microscopySonal Padalkar, Jianxiu Zhao, Kate Stuart, et al.Ultramicroscopy|June 13, 2006
Modifications of stereological correction methods for precipitate parameters using transmission microscopyB SondereggerUltramicroscopy|June 13, 2006
Interpretation of the postpeak in iron fluorides and oxidesFeng Wang, Ray F Egerton, Marek MalacUltramicroscopy|March 21, 2006
Image deconvolution in spherical aberration-corrected high-resolution transmission electron microscopyC Y Tang, J H Chen, H W Zandbergen, et al.Ultramicroscopy|October 24, 2006
A new nano-accuracy AFM system for minimizing Abbe errors and the evaluation of its measuring uncertaintyDongmin Kim, Dong Yeon Lee, Dae Gab GweonPageof 460