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Ultramicroscopy|May 21, 2013
Accurate measurement of Atomic Force Microscope cantilever deflection excluding tip-surface contact with application to force calibrationAshley D Slattery, Adam J Blanch, Jamie S Quinton, et al.Ultramicroscopy|June 18, 2013
Ultrafast electron diffraction pattern simulations using GPU technology. Applications to lattice vibrationsA S Eggeman, A London, P A MidgleyUltramicroscopy|July 9, 2013
Method for local temperature measurement in a nanoreactor for in situ high-resolution electron microscopyS B Vendelbo, P J Kooyman, J F Creemer, et al.Ultramicroscopy|July 10, 2013
Compressed sensing electron tomographyRowan Leary, Zineb Saghi, Paul A Midgley, et al.Ultramicroscopy|July 5, 2013
Comparison of intensity and absolute contrast of simulated and experimental high-resolution transmission electron microscopy images for different multislice simulation methodsFlorian F Krause, Knut Müller, Dennis Zillmann, et al.Ultramicroscopy|July 5, 2013
On the interaction of an ultra-fast laser with a nanometric tip by laser assisted atom probe tomography: a reviewA VellaUltramicroscopy|July 24, 2013
Minimum detection limit and spatial resolution of thin-sample field-emission electron probe microanalysisYugo Kubo, Kotaro Hamada, Akira UranoUltramicroscopy|March 19, 2013
Determining polarity and dislocation core structures at atomic level for epitaxial AlN/(0001)6H-SiC from a single image in HRTEMY X Cui, Y M Wang, C Wen, et al.Ultramicroscopy|March 20, 2013
Low-energy electron reflectivity from graphene: first-principles computations and approximate modelsR M Feenstra, M WidomUltramicroscopy|June 12, 2013
Estimations of bulk geometrically necessary dislocation density using high resolution EBSDT J Ruggles, D T FullwoodPageof 460