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Ultramicroscopy|April 12, 2026
Evaluation method of surface roughness using SEMKei Nagatomo, Takeshi Otsuka, Yuhei Nakajima, et al.Ultramicroscopy|April 7, 2026
About the alignment and 3D reconstruction of sparse cryo-scanning transmission electron tomography datasetsSylvain TrépoutUltramicroscopy|February 26, 2026
Deep learning approaches for dislocation segmentation in TEMAssya Boughrara, Christine Viala, Laurent Dupuy, et al.Ultramicroscopy|March 9, 2026
Calibration-sample free distortion correction of electron diffraction patterns using deep learningMatthew R C Fitzpatrick, Arthur M Blackburn, Cristina CordobaUltramicroscopy|March 15, 2026
FIB-induced gallium contamination as a tool to access aluminium crystallographic information from atom probe tomography dataWilliam Mottay, Masoud Ahmadi, Nicolas Nothomb, et al.Ultramicroscopy|June 29, 2015
New fabrication technique for highly sensitive qPlus sensor with well-defined spring constantHatem Labidi, Martin Kupsta, Taleana Huff, et al.Ultramicroscopy|August 3, 2015
High contrast 3D imaging of surfaces near the wavelength limit using tabletop EUV ptychographyBosheng Zhang, Dennis F Gardner, Matthew D Seaberg, et al.Ultramicroscopy|November 19, 2015
On the optimum resolution of transmission-electron backscattered diffraction (t-EBSD)R van Bremen, D Ribas Gomes, L T H de Jeer, et al.Ultramicroscopy|October 21, 2017
Systematic approaches for targeting an atom-probe tomography sample fabricated in a thin TEM specimen: Correlative structural, chemical and 3-D reconstruction analysesSung-Il Baik, Dieter Isheim, David N SeidmanUltramicroscopy|December 2, 2016
Transition radiation in EELS and cathodoluminescenceMichael Stöger-Pollach, Lukáš Kachtík, Bernhard Miesenberger, et al.Pageof 460