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Ultramicroscopy|March 12, 2017
Depth sectioning combined with atom-counting in HAADF STEM to retrieve the 3D atomic structureM Alania, T Altantzis, A De Backer, et al.
Ultramicroscopy|November 13, 2016
Interpretation of multiscale characterization techniques to assess ferroelectricity: The case of GaFeO3Simon Martin, Nicolas Baboux, David Albertini, et al.
Ultramicroscopy|December 30, 2018
Large angle illumination enabling accurate structure reconstruction from thick samples in scanning transmission electron microscopyH G Brown, R Ishikawa, G S Anchez-Santolino, et al.
Ultramicroscopy|March 20, 2018
Hartmann characterization of the PEEM-3 aberration-corrected X-ray photoemission electron microscopeA Scholl, M A Marcus, A Doran, et al.
Ultramicroscopy|November 10, 2019
A multiple scattering algorithm for three dimensional phase contrast atomic electron tomographyDavid Ren, Colin Ophus, Michael Chen, et al.
Ultramicroscopy|February 12, 2019
Scanning transmission electron microscopy under controlled low-pressure atmospheresGregor T Leuthner, Stefan Hummel, Clemens Mangler, et al.
Ultramicroscopy|February 23, 2020
Inelastic mean free path measurement by STEM-EELS technique using needle-shaped specimenKeiichiro Oh-Ishi, Tetsu Ohsuna
Ultramicroscopy|April 1, 2019
Experimental steering of electron microscopy studies using prior X-ray computed tomographyTobias Starborg, James D B O'Sullivan, Claudia Martins Carneiro, et al.
Ultramicroscopy|January 1, 1988
High-precision tilt stage for the high-voltage electron microscopeJ N Turner, D P Barnard, G Matuszek, et al.
Ultramicroscopy|May 18, 2021
Atomic resolution HOLZ-STEM imaging of atom position modulation in oxide heterostructuresMagnus Nord, Juri Barthel, Christopher S Allen, et al.
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