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Ultramicroscopy|July 10, 2020
Analytical formulae for trajectory displacement in electron beam and generalized slice methodJan StopkaUltramicroscopy|July 15, 2020
Using local GND density to study SCC initiationNaganand Saravanan, Phani S Karamched, Junliang Liu, et al.Ultramicroscopy|August 3, 2020
Deformation and fracture of crystalline tungsten and fabrication of composite STM probesAndrei M Ionov, Sergey V Chekmazov, Victor Usov, et al.Ultramicroscopy|August 3, 2020
Spectral DQE of the Volta phase plateBart Buijsse, Piet Trompenaars, Veli Altin, et al.Ultramicroscopy|August 1, 2020
3D electron backscatter diffraction study of α lath morphology in additively manufactured Ti-6Al-4VRyan DeMott, Peter Collins, Charlie Kong, et al.Ultramicroscopy|November 17, 2012
Inelastic and elastic mean free paths from FIB samples of metallic glassesD T Schweiss, Jinwoo Hwang, P M VoylesUltramicroscopy|November 17, 2012
Variable magnification dual lens electron holography for semiconductor junction profiling and strain mappingY Y Wang, J Li, A Domenicucci, et al.Ultramicroscopy|June 16, 2014
Novel field emission SEM column with beam deceleration technologyJaroslav Jiruše, Miloslav Havelka, Filip LopourUltramicroscopy|June 21, 2014
Atomic resolution mapping of phonon excitations in STEM-EELS experimentsR Egoavil, N Gauquelin, G T Martinez, et al.Ultramicroscopy|February 11, 2015
An APT investigation of an amorphous Cr-B-C thin filmT Boll, M Thuvander, S Koch, et al.Pageof 460