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Ultramicroscopy|August 23, 2012
Strain mapping of LED devices by dark-field inline electron holography: comparison between deterministic and iterative phase retrieval approachesKyung Song, Ga-Young Shin, Jong Kyu Kim, et al.
Ultramicroscopy|June 26, 2012
Regularization mechanism in blind tip reconstruction procedureG Jóźwiak, A Henrykowski, A Masalska, et al.
Ultramicroscopy|June 26, 2012
Improvement of the accuracy of phase observation by modification of phase-shifting electron holographyTakahiro Suzuki, Shinji Aizawa, Toshiaki Tanigaki, et al.
Ultramicroscopy|June 26, 2012
Contact detection for nanomanipulation in a scanning electron microscopeChanghai Ru, Steve To
Ultramicroscopy|March 23, 2010
Scanning probe lithography for fabrication of Ti metal nanodot arraysB Jung, W Jo, M J Gwon, et al.
Ultramicroscopy|March 26, 2010
MEMS-based fast scanning probe microscopesF C Tabak, E C M Disseldorp, G H Wortel, et al.
Ultramicroscopy|March 26, 2010
Fabrication of ionic liquid thin film by nano-inkjet printing method using atomic force microscope cantilever tipKiyohiro Kaisei, Kei Kobayashi, Kazumi Matsushige, et al.
Ultramicroscopy|January 19, 2010
Immobilization method of yeast cells for intermittent contact mode imaging using the atomic force microscopeTathagata De, Antony M Chettoor, Pranav Agarwal, et al.
Ultramicroscopy|December 22, 2009
Noise in off-axis type holograms including reconstruction and CCD camera parametersEdgar Voelkl
Ultramicroscopy|October 11, 2021
L-shell ionization of Cd: Structure of the x-ray emission spectrumF Fernandez, A Sepúlveda, J Trincavelli, et al.
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