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Ultramicroscopy|November 30, 2010
Imaging properties of bright-field and annular-dark-field scanning confocal electron microscopyK Mitsuishi, A Hashimoto, M Takeguchi, et al.Ultramicroscopy|January 20, 2009
Nanotribological properties of precision-controlled regular nanotexture on H-passivated Si surface by current-induced local anodic oxidationYufei Mo, Wenjie Zhao, Deming Huang, et al.Ultramicroscopy|August 13, 2010
A new model for investigating the flexural vibration of an atomic force microscope cantileverMohammad Abbasi, Ardeshir Karami MohammadiUltramicroscopy|August 17, 2010
Image simulations of kinked vortices for transmission electron microscopyM Beleggia, G Pozzi, A TonomuraUltramicroscopy|November 2, 2010
On the measurement of thickness in nanoporous materials by EELSNan Jiang, Dong Su, John C H SpenceUltramicroscopy|March 15, 2011
An improved method to identify grain boundary creep cavitation in 316H austenitic stainless steelB Chen, P E J Flewitt, D J Smith, et al.Ultramicroscopy|March 15, 2011
Towards high accuracy calibration of electron backscatter diffraction systemsKen Mingard, Austin Day, Claire Maurice, et al.Ultramicroscopy|April 20, 2019
A method of z-tomography using high-aperture soft X-ray microscopyIlya V Malyshev, Nikolay I ChkhaloUltramicroscopy|June 25, 2019
Calibrating lateral displacement sensitivity of AFM by stick-slip on stiff, amorphous surfacesLiangyong Chu, Marcel Bus, Alexander V Korobko, et al.Ultramicroscopy|June 25, 2019
Feasible atomic-resolution electron tomography for general crystal surfaces by quantitative reconstruction from a high-resolution imageR H Shen, W Q Ming, J H Chen, et al.Pageof 460