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Ultramicroscopy|November 28, 2006
Low-voltage cross-sectional EBIC for characterisation of GaN-based light emitting devicesGrigore Moldovan, Payam Kazemian, Paul R Edwards, et al.Ultramicroscopy|December 19, 2006
A complete analysis of the laser beam deflection systems used in cantilever-based systemsL Y Beaulieu, Michel Godin, Olivier Laroche, et al.Ultramicroscopy|August 19, 2007
Energy-loss near-edge structure (ELNES) and first-principles calculation of electronic structure of nickel silicide systemsNaohiko Kawasaki, Naoyuki Sugiyama, Yuji Otsuka, et al.Ultramicroscopy|July 24, 2007
Attachment of carbon nanotubes to atomic force microscope probesChristopher T Gibson, Stewart Carnally, Clive J RobertsUltramicroscopy|June 30, 2007
Continuous planar phospholipid bilayer supported on porous silicon thin film reflectorFrédérique Cunin, Pierre-Emmanuel Milhiet, Emily Anglin, et al.Ultramicroscopy|July 28, 2006
First experimental test of a new monochromated and aberration-corrected 200 kV field-emission scanning transmission electron microscopeT Walther, E Quandt, H Stegmann, et al.Ultramicroscopy|July 28, 2006
Evolution of ELNES spectra as a function of experimental settings for any uniaxial specimen: a fully relativistic studyF Bocquet, N Bernier, W Saikaly, et al.Ultramicroscopy|May 8, 2007
Investigation of the site occupation of atoms in pure and doped TiAl/Ti3Al intermetallicT Boll, T Al-Kassab, Y Yuan, et al.Ultramicroscopy|May 8, 2007
Atom probe specimen fabrication methods using a dual FIB/SEMD W Saxey, J M Cairney, D McGrouther, et al.Ultramicroscopy|May 9, 2007
A flux-preserving non-linear inline holography reconstruction algorithm for partially coherent electronsChristoph T KochPageof 460