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Ultramicroscopy|August 6, 2021
A new sample preparation protocol for SEM and TEM particulate matter analysisAnkur Sinha, Gloria Ischia, Giovanni Straffelini, et al.
Ultramicroscopy|August 3, 2021
Dose measurement in the TEM and STEMR F Egerton
Ultramicroscopy|June 17, 2020
Graphene encapsulation enabled high-throughput atom probe tomography of liquid specimensShi Qiu, Vivek Garg, Shuo Zhang, et al.
Ultramicroscopy|November 24, 2004
On the transport of intensity technique for phase retrievalM Beleggia, M A Schofield, V V Volkov, et al.
Ultramicroscopy|November 24, 2004
The magic angle: a solved mysteryB Jouffrey, P Schattschneider, C Hébert
Ultramicroscopy|November 24, 2004
Noise bias in the refinement of structures derived from single particlesAlex Stewart, Nikolaus Grigorieff
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