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Ultramicroscopy|December 3, 2014
Dark-field imaging based on post-processed electron backscatter diffraction patterns of bulk crystalline materials in a scanning electron microscopeNicolas Brodusch, Hendrix Demers, Raynald GauvinUltramicroscopy|December 3, 2014
Adaptive and robust statistical methods for processing near-field scanning microwave microscopy imagesK J Coakley, A Imtiaz, T M Wallis, et al.Ultramicroscopy|December 3, 2014
Spectrum imaging of complex nanostructures using DualEELS: I. Digital extraction replicasJoanna Bobynko, Ian MacLaren, Alan J CravenUltramicroscopy|October 31, 2015
Pattern matching approach to pseudosymmetry problems in electron backscatter diffractionGert Nolze, Aimo Winkelmann, Alan P BoyleUltramicroscopy|October 31, 2015
AFM tip characterization by using FFT filtered images of step structuresYongda Yan, Bo Xue, Zhenjiang Hu, et al.Ultramicroscopy|November 2, 2015
A simple approach to atom probe sample preparation by using shadow masksPeter Felfer, Ingrid McCarroll, Chandra Macauley, et al.Ultramicroscopy|November 2, 2015
Synchronizing atomic force microscopy force mode and fluorescence microscopy in real time for immune cell stimulation and activation studiesSéverine Cazaux, Anaïs Sadoun, Martine Biarnes-Pelicot, et al.Ultramicroscopy|April 20, 2016
Local, atomic-level elastic strain measurements of metallic glass thin films by electron diffractionC Ebner, R Sarkar, J Rajagopalan, et al.Ultramicroscopy|May 26, 2019
Beyond imaging: Applications of atomic force microscopy for the study of Lithium-ion batteriesWeidong Zhao, Wentao Song, Ling-Zhi Cheong, et al.Ultramicroscopy|May 26, 2019
Fluctuations of focused electron beam in a conventional SEMAlexandr Knápek, Josef Šikula, Milada BartlováPageof 460