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Ultramicroscopy|February 14, 2022
Observation of grain boundary plasmon and associated deconvolution techniques for low-loss electron energy-loss (EEL) spectra acquired from grain boundariesProloy Nandi, Eric R Hoglund, James M HoweUltramicroscopy|September 16, 2018
Active control of acoustics-caused nano-vibration in atomic force microscope imagingSicheng Yi, Tianwei Li, Qingze ZouUltramicroscopy|January 1, 1986
Odd men out: a quantitative objective procedure for identifying anomalous members of a set of noisy images of ostensibly identical specimensM Unser, A C Steven, B L TrusUltramicroscopy|September 1, 2018
Progress and prospects of aberration-corrected STEM for functional materialsHaijun Wu, Xiaoxu Zhao, Dongsheng Song, et al.Ultramicroscopy|September 1, 2018
Spatial dimensions in atomic force microscopy: Instruments, effects, and measurementsRonald Dixson, Ndubuisi Orji, Ichiko Misumi, et al.Ultramicroscopy|September 3, 2018
Scattering intensity distribution dependence on collection angles in annular dark-field STEM-in-SEM imagesJason HolmUltramicroscopy|September 5, 2018
Role of photostriction and photothemal effects in photon induced deflection of Si microcantileversM Raghu Ramaiah, K Prabakar, S Tripura SundariUltramicroscopy|September 30, 2018
Non-destructive analysis on nano-textured surface of the vertical LED for light enhancementMansoor Ali Khan, Pengju Bian, Jiangtao Qu, et al.Ultramicroscopy|October 2, 2018
Direct investigation of charge transfer in neurons by electrostatic force microscopyWeidong Zhao, Wei Cui, Shujun Xu, et al.Ultramicroscopy|October 2, 2018
Study on the optical properties of the magnetic circuit corner shape of the magnetic lensHe Chen, Quanlin Dong, Pengfei Wang, et al.Pageof 460