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Ultramicroscopy|July 8, 2008
Electron beam lithography-assisted fabrication of Au nano-dot array as a substrate of a correlated AFM and confocal Raman spectroscopySeung Woo Lee, Yong-Beom Shin, Ki Seok Jeon, et al.Ultramicroscopy|July 28, 2007
Fringe contrast in inelastic LACBED holographyPeter Schattschneider, Jo VerbeeckUltramicroscopy|June 27, 2008
Study of strained-silicon channel metal-oxide-semiconductor field effect transistors by large angle convergent-beam electron diffractionH H Liu, X F Duan, Qiuxia Xu, et al.Ultramicroscopy|July 22, 2008
Three-dimensional imaging in double aberration-corrected scanning confocal electron microscopy, part I: elastic scatteringE C Cosgriff, A J D'Alfonso, L J Allen, et al.Ultramicroscopy|July 29, 2008
In situ dynamic HR-TEM and EELS study on phase transitions of Ge2Sb2Te5 chalcogenidesSe Ahn Song, Wei Zhang, Hong Sik Jeong, et al.Ultramicroscopy|July 23, 2008
X-ray analysis and mapping by wavelength dispersive X-ray spectroscopy in an electron microscopeMiyoko Tanaka, Masaki Takeguchi, Kazuo FuruyaUltramicroscopy|June 20, 2008
A study on conformational changes by electron charges in viologen single molecules by using STMNam-Suk Lee, Won-Suk Choi, Hoon-Kyu Shin, et al.Ultramicroscopy|June 20, 2008
Construction of pcAFM module to measure photoconductance with a nanoscale spatial resolutionJeongjin Lee, Inhee Choi, Surin Hong, et al.Ultramicroscopy|June 20, 2008
Preparation and characterization of nanoporous polyimide films from triblock copolyimidesSung-Youl Cho, Chang-Hyung Lee, Se Young Oh, et al.Ultramicroscopy|June 20, 2008
Investigation of CdS thin films by a near-field microwave microprobeTigran Sargsyan, Artur Hovsepyan, Harutyun Melikyan, et al.Pageof 460