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Ultramicroscopy
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March 30, 2019
Low-energy electron properties: Electron inelastic mean free path, energy loss function and the dielectric function. Recent measurements, applications, and the plasmon-coupling theory
C T Chantler, J D Bourke
Ultramicroscopy
|
March 3, 2019
NLPAR: Non-local smoothing for enhanced EBSD pattern indexing
Patrick T Brewick, Stuart I Wright, David J Rowenhorst
Ultramicroscopy
|
October 16, 2009
Probing the local temperature by in situ electron microscopy on a heated Si(3)N(4) membrane
A Reguer, F Bedu, S Nitsche, et al.
Ultramicroscopy
|
February 25, 2014
CTER-rapid estimation of CTF parameters with error assessment
Pawel A Penczek, Jia Fang, Xueming Li, et al.
Ultramicroscopy
|
April 6, 2017
A spectromicroscope for nanophysics
M Kociak, A Gloter, O Stéphan
Ultramicroscopy
|
April 12, 2017
Work function mapping of MoO<sub>x</sub> thin-films for application in electronic devices
André L F Cauduro, Roberto Dos Reis, Gong Chen, et al.
Ultramicroscopy
|
January 23, 2017
Multi-MHz micro-electro-mechanical sensors for atomic force microscopy
Bernard Legrand, Jean-Paul Salvetat, Benjamin Walter, et al.
Ultramicroscopy
|
June 14, 2008
Superporous agarose beads as a solid support for microfluidic immunoassay
Yoonsun Yang, Seong-Won Nam, Nae Yoon Lee, et al.
Ultramicroscopy
|
June 14, 2008
Dispersion properties of aqueous-based LiFePO4 pastes and their electrochemical performance for lithium batteries
Jin-Hyon Lee, Jeom-Soo Kim, Yoon Chang Kim, et al.
Ultramicroscopy
|
June 4, 2008
Bloch wave-based calculation of imaging properties of high-resolution scanning confocal electron microscopy
K Mitsuishi, K Iakoubovskii, M Takeguchi, et al.
Page
of 458
Search research articles
Search
Showing results (381-390 of 4,574) with videos related to
Sort By:
Page
of 458
Ultramicroscopy
|
March 30, 2019
Low-energy electron properties: Electron inelastic mean free path, energy loss function and the dielectric function. Recent measurements, applications, and the plasmon-coupling theory
C T Chantler, J D Bourke
Ultramicroscopy
|
March 3, 2019
NLPAR: Non-local smoothing for enhanced EBSD pattern indexing
Patrick T Brewick, Stuart I Wright, David J Rowenhorst
Ultramicroscopy
|
October 16, 2009
Probing the local temperature by in situ electron microscopy on a heated Si(3)N(4) membrane
A Reguer, F Bedu, S Nitsche, et al.
Ultramicroscopy
|
February 25, 2014
CTER-rapid estimation of CTF parameters with error assessment
Pawel A Penczek, Jia Fang, Xueming Li, et al.
Ultramicroscopy
|
April 6, 2017
A spectromicroscope for nanophysics
M Kociak, A Gloter, O Stéphan
Ultramicroscopy
|
April 12, 2017
Work function mapping of MoO<sub>x</sub> thin-films for application in electronic devices
André L F Cauduro, Roberto Dos Reis, Gong Chen, et al.
Ultramicroscopy
|
January 23, 2017
Multi-MHz micro-electro-mechanical sensors for atomic force microscopy
Bernard Legrand, Jean-Paul Salvetat, Benjamin Walter, et al.
Ultramicroscopy
|
June 14, 2008
Superporous agarose beads as a solid support for microfluidic immunoassay
Yoonsun Yang, Seong-Won Nam, Nae Yoon Lee, et al.
Ultramicroscopy
|
June 14, 2008
Dispersion properties of aqueous-based LiFePO4 pastes and their electrochemical performance for lithium batteries
Jin-Hyon Lee, Jeom-Soo Kim, Yoon Chang Kim, et al.
Ultramicroscopy
|
June 4, 2008
Bloch wave-based calculation of imaging properties of high-resolution scanning confocal electron microscopy
K Mitsuishi, K Iakoubovskii, M Takeguchi, et al.
Page
of 458