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Ultramicroscopy|March 30, 2019
Low-energy electron properties: Electron inelastic mean free path, energy loss function and the dielectric function. Recent measurements, applications, and the plasmon-coupling theoryC T Chantler, J D BourkeUltramicroscopy|March 3, 2019
NLPAR: Non-local smoothing for enhanced EBSD pattern indexingPatrick T Brewick, Stuart I Wright, David J RowenhorstUltramicroscopy|October 16, 2009
Probing the local temperature by in situ electron microscopy on a heated Si(3)N(4) membraneA Reguer, F Bedu, S Nitsche, et al.Ultramicroscopy|February 25, 2014
CTER-rapid estimation of CTF parameters with error assessmentPawel A Penczek, Jia Fang, Xueming Li, et al.Ultramicroscopy|April 12, 2017
Work function mapping of MoOx thin-films for application in electronic devicesAndré L F Cauduro, Roberto Dos Reis, Gong Chen, et al.Ultramicroscopy|January 23, 2017
Multi-MHz micro-electro-mechanical sensors for atomic force microscopyBernard Legrand, Jean-Paul Salvetat, Benjamin Walter, et al.Ultramicroscopy|June 14, 2008
Superporous agarose beads as a solid support for microfluidic immunoassayYoonsun Yang, Seong-Won Nam, Nae Yoon Lee, et al.Ultramicroscopy|June 14, 2008
Dispersion properties of aqueous-based LiFePO4 pastes and their electrochemical performance for lithium batteriesJin-Hyon Lee, Jeom-Soo Kim, Yoon Chang Kim, et al.Ultramicroscopy|June 4, 2008
Bloch wave-based calculation of imaging properties of high-resolution scanning confocal electron microscopyK Mitsuishi, K Iakoubovskii, M Takeguchi, et al.Pageof 460