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Ultramicroscopy|December 2, 2016
Mapping 180° polar domains using electron backscatter diffraction and dynamical scattering simulationsMatthew J Burch, Chris M Fancher, Srikanth Patala, et al.
Ultramicroscopy|March 28, 2021
ab initio description of bonding for transmission electron microscopyJacob Madsen, Timothy J Pennycook, Toma Susi
Ultramicroscopy|March 28, 2021
Coherent light emission in cathodoluminescence when using GaAs in a scanning (transmission) electron microscopeMichael Stöger-Pollach, Cornelia F Pichler, Topa Dan, et al.
Ultramicroscopy|April 12, 2015
Removing the effects of the "dark matter" in tomographyLionel C Gontard
Ultramicroscopy|March 28, 2015
Quantitative analysis of Si/SiGeC superlattices using atom probe tomographyRobert Estivill, Adeline Grenier, Sébastien Duguay, et al.
Ultramicroscopy|April 1, 2015
Field evaporation of insulators and semiconductors: Theoretical insights for ZnOMarkus Karahka, H J Kreuzer
Ultramicroscopy|February 28, 2015
Modeling Atom Probe Tomography: A reviewF Vurpillot, C Oberdorfer
Ultramicroscopy|April 4, 2015
Diffraction contrast imaging using virtual aperturesChristoph Gammer, V Burak Ozdol, Christian H Liebscher, et al.
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